Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices
[EN]To manufacture faster electron devices, the industry has entered into the nanoscale dimensions and Terahertz (THz) working frequencies. The discrete nature of the few electrons present simultaneously in the active region of ultra-small devices generate unavoidable fluctuations of the current at...
| Autores: | , , , |
|---|---|
| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2020 |
| País: | España |
| Institución: | Universidad de Salamanca (USAL) |
| Repositorio: | GREDOS. Repositorio Institucional de la Universidad de Salamanca |
| OAI Identifier: | oai:gredos.usal.es:10366/144050 |
| Acceso en línea: | http://hdl.handle.net/10366/144050 |
| Access Level: | acceso abierto |
| Palabra clave: | Noise THz Nanodevices |
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Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devicesColomés, EnriqueMateos López, JavierGonzález Sánchez, TomásOriols, XavierNoiseTHzNanodevices[EN]To manufacture faster electron devices, the industry has entered into the nanoscale dimensions and Terahertz (THz) working frequencies. The discrete nature of the few electrons present simultaneously in the active region of ultra-small devices generate unavoidable fluctuations of the current at THz frequencies. The consequences of this noise remain unnoticed in the scientific community because its accurate understanding requires dealing with consecutive multi-time quantum measurements. Here, a modeling of the quantum measurement of the current at THz frequencies is introduced in terms of quantum (Bohmian) trajectories. With this new understanding, we develop an analytic model for THz noise as a function of the electron transit time and the sampling integration time, which finally determine the maximum device working frequency for digital applications. The model is confirmed by either semi-classical or full- quantum time-dependent Monte Carlo simulations. All these results show that intrinsic THz noise increases unlimitedly when the volume of the active region decreases. All attempts to minimize the low signal-to-noise ratio of these ultra-small devices to get effective THz working frequencies are incompatible with the basic elements of the scaling strategy. One can develop THz electron devices, but they cannot have ultra-small dimensions. Or, one can fabricate ultra-small electron devices, but they cannot be used for THz working frequencies.“Ministerio de Ciencia, Innovación y Universidades” under Grant No. RTI2018-097876-B-C21 (MCIU/AEI/FEDER, UE) and TEC2017-83910-R, the Consejería de Educación de la Junta de Castilla y León (project SA254P18), the Generalitat de Catalunya and FEDER for the project QUANTUMCAT 001-P-001644, the European Union’s Horizon 2020 research and innovation programme under grant agreement No Graphene Core2 785219 and under the Marie Skodowska-Curie grant agreement No 765426 (TeraApps).202020202020info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfhttp://hdl.handle.net/10366/144050reponame:GREDOS. Repositorio Institucional de la Universidad de Salamancainstname:Universidad de Salamanca (USAL)InglésRTI2018-097876-B-C21TEC2017-83910-RSA254P18001-P-001644Graphene Core2 785219Marie Skodowska-Curie grant agreement No 765426info:eu-repo/semantics/openAccessoai:gredos.usal.es:10366/1440502026-06-07T06:28:51Z |
| dc.title.none.fl_str_mv |
Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices |
| title |
Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices |
| spellingShingle |
Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices Colomés, Enrique Noise THz Nanodevices |
| title_short |
Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices |
| title_full |
Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices |
| title_fullStr |
Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices |
| title_full_unstemmed |
Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices |
| title_sort |
Noise and charge discreteness as ultimate limit for the THz operation of ultra-small electronic devices |
| dc.creator.none.fl_str_mv |
Colomés, Enrique Mateos López, Javier González Sánchez, Tomás Oriols, Xavier |
| author |
Colomés, Enrique |
| author_facet |
Colomés, Enrique Mateos López, Javier González Sánchez, Tomás Oriols, Xavier |
| author_role |
author |
| author2 |
Mateos López, Javier González Sánchez, Tomás Oriols, Xavier |
| author2_role |
author author author |
| dc.subject.none.fl_str_mv |
Noise THz Nanodevices |
| topic |
Noise THz Nanodevices |
| description |
[EN]To manufacture faster electron devices, the industry has entered into the nanoscale dimensions and Terahertz (THz) working frequencies. The discrete nature of the few electrons present simultaneously in the active region of ultra-small devices generate unavoidable fluctuations of the current at THz frequencies. The consequences of this noise remain unnoticed in the scientific community because its accurate understanding requires dealing with consecutive multi-time quantum measurements. Here, a modeling of the quantum measurement of the current at THz frequencies is introduced in terms of quantum (Bohmian) trajectories. With this new understanding, we develop an analytic model for THz noise as a function of the electron transit time and the sampling integration time, which finally determine the maximum device working frequency for digital applications. The model is confirmed by either semi-classical or full- quantum time-dependent Monte Carlo simulations. All these results show that intrinsic THz noise increases unlimitedly when the volume of the active region decreases. All attempts to minimize the low signal-to-noise ratio of these ultra-small devices to get effective THz working frequencies are incompatible with the basic elements of the scaling strategy. One can develop THz electron devices, but they cannot have ultra-small dimensions. Or, one can fabricate ultra-small electron devices, but they cannot be used for THz working frequencies. |
| publishDate |
2020 |
| dc.date.none.fl_str_mv |
2020 2020 2020 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion |
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article |
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publishedVersion |
| dc.identifier.none.fl_str_mv |
http://hdl.handle.net/10366/144050 |
| url |
http://hdl.handle.net/10366/144050 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.relation.none.fl_str_mv |
RTI2018-097876-B-C21 TEC2017-83910-R SA254P18 001-P-001644 Graphene Core2 785219 Marie Skodowska-Curie grant agreement No 765426 |
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info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
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application/pdf |
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reponame:GREDOS. Repositorio Institucional de la Universidad de Salamanca instname:Universidad de Salamanca (USAL) |
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Universidad de Salamanca (USAL) |
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GREDOS. Repositorio Institucional de la Universidad de Salamanca |
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GREDOS. Repositorio Institucional de la Universidad de Salamanca |
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1869419994475921408 |
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15,301603 |