Real-space image of charged patches in tunable-size nanocrystals

The remarkable dual nature of faceted-charge patchy metal fluoride nanocrystals arises from the spontaneous selective coordination of anionic and cationic ligands on the different facets of the nanocrystals. In previous studies, the identification and origin of the charge at the patches were obtaine...

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Detalles Bibliográficos
Autores: Martínez-Esaín, Jordi|||0000-0002-8420-8559, Pérez Rodríguez, Ana, Faraudo, Jordi|||0000-0002-6315-4993, Barrena, Esther|||0000-0001-9163-2959, Yáñez, Ramón|||0000-0002-2021-0924, Ocal García, Carmen|||0000-0001-8790-8844, Ricart, Susagna
Tipo de recurso: artículo
Fecha de publicación:2022
País:España
Institución:Universitat Autònoma de Barcelona
Repositorio:Dipòsit Digital de Documents de la UAB
Idioma:inglés
OAI Identifier:oai:ddd.uab.cat:256369
Acceso en línea:https://ddd.uab.cat/record/256369
https://dx.doi.org/urn:doi:10.3390/ma15041455
Access Level:acceso abierto
Palabra clave:Patchy nanocrystals
Charged patches
HRTEM
KPFM
Descripción
Sumario:The remarkable dual nature of faceted-charge patchy metal fluoride nanocrystals arises from the spontaneous selective coordination of anionic and cationic ligands on the different facets of the nanocrystals. In previous studies, the identification and origin of the charge at the patches were obtained by combining computer simulations with indirect experimental evidence. Taking a step further, we report herein the first direct real-space identification by Kelvin probe force microscopy of the predicted faceted-charge patchy behavior, allowing the image of the dual faceted-charge surfaces. High-resolution transmission electron microscopy reveals the detailed nanocrystal faceting and allows unambiguously inferring the hydrophilic or hydrophobic role of each facet from the identification of the surface atoms exposed at the respective crystallographic planes. The success of the study lies in a foresighted synthesis methodology designed to tune the nanocrystal size to be suitable for microscopy studies and demanding applications.