Indirect model for roughness in rough honing processes based on artificial neural networks
In the present paper an indirect model based on neural networks is presented for modelling the rough honing process. It allows obtaining values to be set for different process variables (linear speed, tangential speed, pressure of abrasive stones, grain size of abrasive and density of abrasive) as a...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2016 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/82884 |
| Acceso en línea: | https://hdl.handle.net/2117/82884 https://dx.doi.org/10.1016/j.precisioneng.2015.09.004 |
| Access Level: | acceso abierto |
| Palabra clave: | Surface roughness Neural networks (Computer science) Honing machines Artificial neural networks Honing Indirect model Brunyiment Enginyeria mecànica -- Informàtica Àrees temàtiques de la UPC::Enginyeria mecànica::Processos de fabricació mecànica::Fabricació assistida per ordinador |
| Sumario: | In the present paper an indirect model based on neural networks is presented for modelling the rough honing process. It allows obtaining values to be set for different process variables (linear speed, tangential speed, pressure of abrasive stones, grain size of abrasive and density of abrasive) as a function of required average roughness Ra. A multilayer perceptron (feedforward) with a backpropagation (BP) training system was used for defining neural networks. Several configurations were tested with different number of layers, number of neurons and type of transfer function. Best configuration for the network was searched by means of two different methods, trial and error and Taguchi design of experiments (DOE). Once best configuration was found, a network was defined by means of trial and error method for roughness parameters related to Abbott-Firestone curve, Rk, Rpk and Rvk. © 2015 Elsevier Inc. All rights reserved |
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