Electric-field screening in atomically thin layers of MoS2: The role of interlayer coupling
The electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas-Fermi theory is employed to interpret the exper...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2013 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/94241 |
| Acceso en línea: | http://hdl.handle.net/10261/94241 |
| Access Level: | acceso abierto |
| Palabra clave: | MoS2 Thomas–Fermi theory Two-dimensional crystals Electric-field screening |
| Sumario: | The electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas-Fermi theory is employed to interpret the experimental results, demonstrating the important role of the interlayer coupling in the screening of MoS2. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. |
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