Characterisation and optimal design of a new double sampling c chart
[EN] This paper proposes a new double sampling scheme for c control chart (DS-c), which was designed to improve the performance of c chart or to reduce the inspection cost. The mathematical expression required to do an exact evaluation of ARL and ASN is deduced. Further, a bi-objective genetic algor...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2019 |
| País: | España |
| Institución: | Universitat Politècnica de València (UPV) |
| Repositorio: | RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia |
| Idioma: | inglés |
| OAI Identifier: | oai:riunet.upv.es:10251/156417 |
| Acceso en línea: | https://riunet.upv.es/handle/10251/156417 |
| Access Level: | acceso abierto |
| Palabra clave: | Statistical process control Number of non-conformities C chart Double sampling Optimal design ESTADISTICA E INVESTIGACION OPERATIVA |
| Sumario: | [EN] This paper proposes a new double sampling scheme for c control chart (DS-c), which was designed to improve the performance of c chart or to reduce the inspection cost. The mathematical expression required to do an exact evaluation of ARL and ASN is deduced. Further, a bi-objective genetic algorithm is implemented to obtain the optimal design of the DS-c scheme. This optimisation is aimed to simultaneously minimising the error probability type II and the ASN, guaranteeing a desired level for the error probability type I. A performance comparison between the double sampling (DS), fixed parameters (FP), variable simple size (VSS) and exponential weighted moving average (EWMA) schemes for the c chart is carried out. The comparison shows that with the implementation of DS-c scheme is obtained a significant reduction of the out of control ARL with a lower ASN respect to FP and a better ARL profile than VSS and EWMA. |
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