Pseudo-sample based contribution plots: innovative tools for fault diagnosis in kernel-based batch process monitoring

[EN] This article explores the potential of kernel-based methods for fault diagnosis in batch process monitoring by combining Kernel-Principal Component Analysis and three common techniques which permit analyzing batch data by means of bilinear models: variable-wise unfolding, batch-wise unfolding a...

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Detalles Bibliográficos
Autores: Vitale, Raffaele, Noord, Onno E. de, Ferrer, Alberto|||0000-0001-7244-5947
Tipo de recurso: artículo
Fecha de publicación:2015
País:España
Institución:Universitat Politècnica de València (UPV)
Repositorio:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Idioma:inglés
OAI Identifier:oai:riunet.upv.es:10251/64903
Acceso en línea:https://riunet.upv.es/handle/10251/64903
Access Level:acceso abierto
Palabra clave:Kernel-based techniques
Batch process monitoring
Pseudo-sample projection
Contribution plots
Fault detection
Fault diagnosis
ESTADISTICA E INVESTIGACION OPERATIVA
Descripción
Sumario:[EN] This article explores the potential of kernel-based methods for fault diagnosis in batch process monitoring by combining Kernel-Principal Component Analysis and three common techniques which permit analyzing batch data by means of bilinear models: variable-wise unfolding, batch-wise unfolding and landmark feature extraction. Gower's idea of pseudo-sample projection is exploited to develop novel tools, the pseudo-sample based contribution plots, for diagnostic purposes. The results show that, when the datasets under study are affected by severe non-linearities, the proposed approach performs better than classical ones.