Pseudo-sample based contribution plots: innovative tools for fault diagnosis in kernel-based batch process monitoring
[EN] This article explores the potential of kernel-based methods for fault diagnosis in batch process monitoring by combining Kernel-Principal Component Analysis and three common techniques which permit analyzing batch data by means of bilinear models: variable-wise unfolding, batch-wise unfolding a...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2015 |
| País: | España |
| Institución: | Universitat Politècnica de València (UPV) |
| Repositorio: | RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia |
| Idioma: | inglés |
| OAI Identifier: | oai:riunet.upv.es:10251/64903 |
| Acceso en línea: | https://riunet.upv.es/handle/10251/64903 |
| Access Level: | acceso abierto |
| Palabra clave: | Kernel-based techniques Batch process monitoring Pseudo-sample projection Contribution plots Fault detection Fault diagnosis ESTADISTICA E INVESTIGACION OPERATIVA |
| Sumario: | [EN] This article explores the potential of kernel-based methods for fault diagnosis in batch process monitoring by combining Kernel-Principal Component Analysis and three common techniques which permit analyzing batch data by means of bilinear models: variable-wise unfolding, batch-wise unfolding and landmark feature extraction. Gower's idea of pseudo-sample projection is exploited to develop novel tools, the pseudo-sample based contribution plots, for diagnostic purposes. The results show that, when the datasets under study are affected by severe non-linearities, the proposed approach performs better than classical ones. |
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