Optical security verification by synthesizing thin films with unique polarimetric signatures

This letter reports the production and optical polarimetric verification of codes based on thin-film technology for security applications. Because thin-film structures display distinctive polarization signatures, this data is used to authenticate the message encoded. Samples are analyzed using an im...

ver descrição completa

Detalhes bibliográficos
Autores: Carnicer González, Arturo, Arteaga Barriel, Oriol, Pascual Miralles, Esther, Canillas i Biosca, Adolf, Vallmitjana i Rico, Santiago, Javidi, Bahram, Bertrán Serra, Enric
Formato: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2015
País:España
Recursos:Universidad de Barcelona
Repositorio:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/118511
Acesso em linha:https://hdl.handle.net/2445/118511
Access Level:acceso abierto
Palavra-chave:Reconeixement òptic de formes
Xifratge (Informàtica)
Polarització (Llum)
El·lipsometria
Optical pattern recognition
Data encryption (Computer science)
Polarization (Light)
Ellipsometry
id ES_c0c6ee2fd3e2a06f47811cd42f843bce
oai_identifier_str oai:diposit.ub.edu:2445/118511
network_acronym_str ES
network_name_str España
repository_id_str
spelling Optical security verification by synthesizing thin films with unique polarimetric signaturesCarnicer González, ArturoArteaga Barriel, OriolPascual Miralles, EstherCanillas i Biosca, AdolfVallmitjana i Rico, SantiagoJavidi, BahramBertrán Serra, EnricReconeixement òptic de formesXifratge (Informàtica)Polarització (Llum)El·lipsometriaOptical pattern recognitionData encryption (Computer science)Polarization (Light)EllipsometryThis letter reports the production and optical polarimetric verification of codes based on thin-film technology for security applications. Because thin-film structures display distinctive polarization signatures, this data is used to authenticate the message encoded. Samples are analyzed using an imaging ellipsometer able to measure the 16 components of the Mueller matrix. As a result, the behavior of the thin-film under polarized light becomes completely characterized. This information is utilized to distinguish among true and false codes by means of correlation. Without the imaging optics the components of the Mueller matrix become noise-like distributions and, consequently, the message encoded is no longer available. Then, a set of Stokes vectors are generated numerically for any polarization state of the illuminating beam and thus, machine learning techniques can be used to perform classification. We show that successful authentication is possible using the knearest neighbors algorithm in thin-films codes that have been anisotropically phase-encoded with pseudorandom phase code.Optical Society of America2015info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersionapplication/pdfhttps://hdl.handle.net/2445/118511Articles publicats en revistes (Física Aplicada)reponame:Dipòsit Digital de la UBinstname:Universidad de BarcelonaInglésVersió postprint del document publicat a: https://doi.org/10.1364/OL.40.005399Optics Letters, 2015, vol. 40, num. 22, p. 5399-5402https://doi.org/10.1364/OL.40.005399(c) Optical Society of America, 2015info:eu-repo/semantics/openAccessoai:diposit.ub.edu:2445/1185112026-05-27T06:46:51Z
dc.title.none.fl_str_mv Optical security verification by synthesizing thin films with unique polarimetric signatures
title Optical security verification by synthesizing thin films with unique polarimetric signatures
spellingShingle Optical security verification by synthesizing thin films with unique polarimetric signatures
Carnicer González, Arturo
Reconeixement òptic de formes
Xifratge (Informàtica)
Polarització (Llum)
El·lipsometria
Optical pattern recognition
Data encryption (Computer science)
Polarization (Light)
Ellipsometry
title_short Optical security verification by synthesizing thin films with unique polarimetric signatures
title_full Optical security verification by synthesizing thin films with unique polarimetric signatures
title_fullStr Optical security verification by synthesizing thin films with unique polarimetric signatures
title_full_unstemmed Optical security verification by synthesizing thin films with unique polarimetric signatures
title_sort Optical security verification by synthesizing thin films with unique polarimetric signatures
dc.creator.none.fl_str_mv Carnicer González, Arturo
Arteaga Barriel, Oriol
Pascual Miralles, Esther
Canillas i Biosca, Adolf
Vallmitjana i Rico, Santiago
Javidi, Bahram
Bertrán Serra, Enric
author Carnicer González, Arturo
author_facet Carnicer González, Arturo
Arteaga Barriel, Oriol
Pascual Miralles, Esther
Canillas i Biosca, Adolf
Vallmitjana i Rico, Santiago
Javidi, Bahram
Bertrán Serra, Enric
author_role author
author2 Arteaga Barriel, Oriol
Pascual Miralles, Esther
Canillas i Biosca, Adolf
Vallmitjana i Rico, Santiago
Javidi, Bahram
Bertrán Serra, Enric
author2_role author
author
author
author
author
author
dc.subject.none.fl_str_mv Reconeixement òptic de formes
Xifratge (Informàtica)
Polarització (Llum)
El·lipsometria
Optical pattern recognition
Data encryption (Computer science)
Polarization (Light)
Ellipsometry
topic Reconeixement òptic de formes
Xifratge (Informàtica)
Polarització (Llum)
El·lipsometria
Optical pattern recognition
Data encryption (Computer science)
Polarization (Light)
Ellipsometry
description This letter reports the production and optical polarimetric verification of codes based on thin-film technology for security applications. Because thin-film structures display distinctive polarization signatures, this data is used to authenticate the message encoded. Samples are analyzed using an imaging ellipsometer able to measure the 16 components of the Mueller matrix. As a result, the behavior of the thin-film under polarized light becomes completely characterized. This information is utilized to distinguish among true and false codes by means of correlation. Without the imaging optics the components of the Mueller matrix become noise-like distributions and, consequently, the message encoded is no longer available. Then, a set of Stokes vectors are generated numerically for any polarization state of the illuminating beam and thus, machine learning techniques can be used to perform classification. We show that successful authentication is possible using the knearest neighbors algorithm in thin-films codes that have been anisotropically phase-encoded with pseudorandom phase code.
publishDate 2015
dc.date.none.fl_str_mv 2015
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/118511
url https://hdl.handle.net/2445/118511
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Versió postprint del document publicat a: https://doi.org/10.1364/OL.40.005399
Optics Letters, 2015, vol. 40, num. 22, p. 5399-5402
https://doi.org/10.1364/OL.40.005399
dc.rights.none.fl_str_mv (c) Optical Society of America, 2015
info:eu-repo/semantics/openAccess
rights_invalid_str_mv (c) Optical Society of America, 2015
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Optical Society of America
publisher.none.fl_str_mv Optical Society of America
dc.source.none.fl_str_mv Articles publicats en revistes (Física Aplicada)
reponame:Dipòsit Digital de la UB
instname:Universidad de Barcelona
instname_str Universidad de Barcelona
reponame_str Dipòsit Digital de la UB
collection Dipòsit Digital de la UB
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869418505669967872
score 15,301603