Electronic state characterization of SiOx thin films prepared by evaporation

8 pages, 10 figures.-- PACS: 73.20.At; 79.60.Bm; 78.70.Dm; 71.20.Ps; 71.45.Gm

Bibliographic Details
Authors:	Barranco, Ángel, Yubero, Francisco, Espinós, J.P., Groening, P., González-Elipe, Agustín R.
Format:	article
Publication Date:	2005
Country:	España
Institution:	Consejo Superior de Investigaciones Científicas (CSIC)
Repository:	DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:	oai:digital.csic.es:10261/21742
Online Access:	http://hdl.handle.net/10261/21742
Access Level:	Open access
Keyword:	Silicon compounds Thin films Vacuum deposition Stoichiometry X-ray photoelectron spectra X-ray absorption spectra

Description
Summary:	8 pages, 10 figures.-- PACS: 73.20.At; 79.60.Bm; 78.70.Dm; 71.20.Ps; 71.45.Gm