Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces

The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil pro...

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Autores: Barber, Matías Ernesto, Grings, Francisco Matías, Álvarez-Mozos, Jesús, Piscitelli, Marcela, Perna, Pablo Alejandro, Karszenbaum, Haydee
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2016
País:España
Institución:Universidad San Jorge (USJ)
Repositorio:Academica-e. Repositorio Institucional de la Universidad Pública de Navarra
OAI Identifier:oai:academica-e.unavarra.es:2454/26146
Acceso en línea:https://hdl.handle.net/2454/26146
Access Level:acceso abierto
Palabra clave:Surface soil roughness
Laser profiler
Height standard deviation
Correlation length
Radar applications
Scattering models
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spelling Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfacesBarber, Matías ErnestoGrings, Francisco MatíasÁlvarez-Mozos, JesúsPiscitelli, MarcelaPerna, Pablo AlejandroKarszenbaum, HaydeeSurface soil roughnessLaser profilerHeight standard deviationCorrelation lengthRadar applicationsScattering modelsThe spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil profiles have continuous spectral components, it is clear that roughness parameters are influenced by the sampling interval of the measurement device employed. In this work, we contributed to answer which sampling interval the profiles needed to be measured at to accurately account for the microwave response of agricultural surfaces. For this purpose, a 2-D laser profiler was built and used to measure surface soil roughness at field scale over agricultural sites in Argentina. Sampling intervals ranged from large (50 mm) to small ones (1 mm), with several intermediate values. Large- and intermediate-sampling-interval profiles were synthetically derived from nominal, 1 mm ones. With these data, the effect of sampling-interval-dependent roughness parameters on backscatter response was assessed using the theoretical backscatter model IEM2M. Simulations demonstrated that variations of roughness parameters depended on the working wavelength and was less important at L-band than at C- or X-band. In any case, an underestimation of the backscattering coefficient of about 1-4 dB was observed at larger sampling intervals. As a general rule a sampling interval of 15 mm can be recommended for L-band and 5 mm for C-band.This work was funded by the Agencia Nacional de Promoción Científica y Tecnológica (ANPCyT) (PICT 2060), MinCyT-CONAE-CONICET project 12 and SARAT-SAOCOM project 17.MDPIProyectos e Ingeniería RuralLanda Ingeniaritza eta Proiektuak2016info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfhttps://hdl.handle.net/2454/26146reponame:Academica-e. Repositorio Institucional de la Universidad Pública de Navarrainstname:Universidad San Jorge (USJ)Inglés© 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license.https://creativecommons.org/licenses/by/4.0/info:eu-repo/semantics/openAccessoai:academica-e.unavarra.es:2454/261462026-06-17T12:41:47Z
dc.title.none.fl_str_mv Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
title Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
spellingShingle Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
Barber, Matías Ernesto
Surface soil roughness
Laser profiler
Height standard deviation
Correlation length
Radar applications
Scattering models
title_short Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
title_full Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
title_fullStr Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
title_full_unstemmed Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
title_sort Effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces
dc.creator.none.fl_str_mv Barber, Matías Ernesto
Grings, Francisco Matías
Álvarez-Mozos, Jesús
Piscitelli, Marcela
Perna, Pablo Alejandro
Karszenbaum, Haydee
author Barber, Matías Ernesto
author_facet Barber, Matías Ernesto
Grings, Francisco Matías
Álvarez-Mozos, Jesús
Piscitelli, Marcela
Perna, Pablo Alejandro
Karszenbaum, Haydee
author_role author
author2 Grings, Francisco Matías
Álvarez-Mozos, Jesús
Piscitelli, Marcela
Perna, Pablo Alejandro
Karszenbaum, Haydee
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Proyectos e Ingeniería Rural
Landa Ingeniaritza eta Proiektuak
dc.subject.none.fl_str_mv Surface soil roughness
Laser profiler
Height standard deviation
Correlation length
Radar applications
Scattering models
topic Surface soil roughness
Laser profiler
Height standard deviation
Correlation length
Radar applications
Scattering models
description The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil profiles have continuous spectral components, it is clear that roughness parameters are influenced by the sampling interval of the measurement device employed. In this work, we contributed to answer which sampling interval the profiles needed to be measured at to accurately account for the microwave response of agricultural surfaces. For this purpose, a 2-D laser profiler was built and used to measure surface soil roughness at field scale over agricultural sites in Argentina. Sampling intervals ranged from large (50 mm) to small ones (1 mm), with several intermediate values. Large- and intermediate-sampling-interval profiles were synthetically derived from nominal, 1 mm ones. With these data, the effect of sampling-interval-dependent roughness parameters on backscatter response was assessed using the theoretical backscatter model IEM2M. Simulations demonstrated that variations of roughness parameters depended on the working wavelength and was less important at L-band than at C- or X-band. In any case, an underestimation of the backscattering coefficient of about 1-4 dB was observed at larger sampling intervals. As a general rule a sampling interval of 15 mm can be recommended for L-band and 5 mm for C-band.
publishDate 2016
dc.date.none.fl_str_mv 2016
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dc.identifier.none.fl_str_mv https://hdl.handle.net/2454/26146
url https://hdl.handle.net/2454/26146
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.rights.none.fl_str_mv https://creativecommons.org/licenses/by/4.0/
info:eu-repo/semantics/openAccess
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eu_rights_str_mv openAccess
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dc.source.none.fl_str_mv reponame:Academica-e. Repositorio Institucional de la Universidad Pública de Navarra
instname:Universidad San Jorge (USJ)
instname_str Universidad San Jorge (USJ)
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