Intensity noise characteristics of multimode VCSELs

The intensity noise spectra of several multi-transverse mode 1550-nm vertical-cavity surface-emitting lasers (VCSELs) have been experimentally investigated. For a VCSEL emitting in two parallel polarized transverse modes the noise spectra of the individual modes and total power show two resonance pe...

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Detalles Bibliográficos
Autores: Quirce Teja, Ana, Valle Gutiérrez, Ángel|||0000-0002-3307-5485, Giménez, Carolina, Pesquera Gonzalez, Luis
Tipo de recurso: artículo
Fecha de publicación:2011
País:España
Institución:Universidad de Cantabria (UC)
Repositorio:UCrea Repositorio Abierto de la Universidad de Cantabria
Idioma:inglés
OAI Identifier:oai:repositorio.unican.es:10902/34889
Acceso en línea:https://hdl.handle.net/10902/34889
Access Level:acceso abierto
Palabra clave:Semiconductor lasers
Vertical-cavity surfaceemitting lasers (VCSELs)
Transverse modes
Relative intensity noise (RIN)
Mode partition noise (MPN)
Descripción
Sumario:The intensity noise spectra of several multi-transverse mode 1550-nm vertical-cavity surface-emitting lasers (VCSELs) have been experimentally investigated. For a VCSEL emitting in two parallel polarized transverse modes the noise spectra of the individual modes and total power show two resonance peaks. The frequencies at which both peaks appear have been measured as a function of the bias current. Our experimental results confirm the theoretical predictions of Valle Differences in the noise spectra are experimentally observed when considering a VCSEL emitting in three transverse modes with polarization instabilities. We show that additional peaks appear in the noise spectra of the total power as the bias current is increased.