Experimental validation of the adiabatic assumption of short-circuit tests on bare conductors

©2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to se...

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Detalles Bibliográficos
Autores: Riba Ruiz, Jordi-Roger|||0000-0001-8774-2389, González Farré, David, Bas Calopa, Pau|||0000-0002-7373-4609, Moreno Eguilaz, Juan Manuel|||0000-0001-6086-7034
Tipo de recurso: artículo
Fecha de publicación:2023
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/394723
Acceso en línea:https://hdl.handle.net/2117/394723
https://dx.doi.org/10.1109/TPWRD.2023.3281599
Access Level:acceso abierto
Palabra clave:Thermodynamics
High voltages
Finite element method
Adiabatic
Short-circuit
Simulation
Temperature rise
Thermal model
Tests
Termodinàmica
Alta tensió
Elements finits, Mètode dels
Àrees temàtiques de la UPC::Física::Termodinàmica
Àrees temàtiques de la UPC::Enginyeria elèctrica::Alta tensió
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Sumario:©2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.