Time-dependent shot noise in multi-level quantum dot-based single-electron devices

By means of three-dimensional self-consistent simulation, we investigate the time- and frequency-dependent shot noise in multi-level quantum dot (QD)-based double-tunnel junction by analyzing auto-correlation functions and distribution of waiting times between consecutive tunnel events through a giv...

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Detalles Bibliográficos
Autores: Talbo, Vincent, Mateos López, Javier, Retailleau, Sylvie, Dollfus, Philippe, González Sánchez, Tomás
Tipo de recurso: artículo
Fecha de publicación:2015
País:España
Institución:Universidad de Salamanca (USAL)
Repositorio:GREDOS. Repositorio Institucional de la Universidad de Salamanca
OAI Identifier:oai:gredos.usal.es:10366/130648
Acceso en línea:http://hdl.handle.net/10366/130648
Access Level:acceso abierto
Palabra clave:Shot noise
Single electron device
Monte Carlo method
Double-tunnel junction
Descripción
Sumario:By means of three-dimensional self-consistent simulation, we investigate the time- and frequency-dependent shot noise in multi-level quantum dot (QD)-based double-tunnel junction by analyzing auto-correlation functions and distribution of waiting times between consecutive tunnel events through a given barrier. We derive analytic expressions for correlation and waiting time distributions (WTDs) in the case of a maximum of two electrons in the QD. We separate the contributions of the different evolution paths of the number of electrons in the dot between two consecutive current pulses, called ‘basic paths’. The close relation revealed between probabilities, WTDs and correlation functions associated to basic paths allows a good understanding of the specific dynamics in spectral densities. The analytic results show a perfect agreement with those obtained from numerical Monte-Carlo simulation.