Characterization of thermal oxide films formed on a duplex stainless steel by means of confocal-Raman microscopy and electrochemical techniques
In this work oxide films have been developed on the surface of a duplex stainless steel (UNS 1.4462) using high temperature confocal microscopy to follow their growth. The characteristics of these oxide films have been analyzed by means of weight-gain measurements, Raman microscopy and electrochemic...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2015 |
| País: | España |
| Institución: | Universitat Politècnica de València (UPV) |
| Repositorio: | RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia |
| Idioma: | inglés |
| OAI Identifier: | oai:riunet.upv.es:10251/51029 |
| Acceso en línea: | https://riunet.upv.es/handle/10251/51029 |
| Access Level: | acceso abierto |
| Palabra clave: | Stainless steel Electrochemical impedance spectroscopy Raman spectroscopy Confocal laser microscopy Oxidation Passivation INGENIERIA QUIMICA |
| Sumario: | In this work oxide films have been developed on the surface of a duplex stainless steel (UNS 1.4462) using high temperature confocal microscopy to follow their growth. The characteristics of these oxide films have been analyzed by means of weight-gain measurements, Raman microscopy and electrochemical techniques, namely potentiodynamic polarization curves and electrochemical impedance spectroscopy. The results show an increase in the amount of oxides (particularly γ-Fe2O3 and Fe3O4) with temperature. Regarding the electrochemical properties of these films, the corrosion resistance of the film tends to be lower with the heat treatment temperature, probably due to a more porous and heterogeneous scale. Mott–Schottky plots show the n-type semiconductive behavior of the films with donor densities that decrease with the enhancement of the temperature. |
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