Graphene Plasmon Reflection by Corrugations
Graphene plasmons (GPs) exhibit extreme confinement of the associated electromagnetic fields. For that reason, they are promising candidates for controlling light in nanoscale devices. However, despite the ubiquitous presence of surface corrugations in graphene, very little is known on how they affe...
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2017 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/164391 |
| Acceso en línea: | http://hdl.handle.net/10261/164391 |
| Access Level: | acceso abierto |
| Palabra clave: | Graphene wrinkles Plasmon propagation Scattering |
| Sumario: | Graphene plasmons (GPs) exhibit extreme confinement of the associated electromagnetic fields. For that reason, they are promising candidates for controlling light in nanoscale devices. However, despite the ubiquitous presence of surface corrugations in graphene, very little is known on how they affect the propagation of GPs. Here we perform a comprehensive theoretical analysis of GP scattering by both smooth and sharp corrugations. For smooth corrugations, we demonstrate that scattering of GPs depends on the dielectric environment, being strongly suppressed when graphene is placed between two dielectrics with the same refractive indices. We also show that sharp corrugations can act as effective GP reflectors, even when their dimensions are small in comparison with the GP wavelength. Additionally, we provide simple analytical expressions for the reflectance of GPs valid in an ample parametric range. Finally, we connect these results with potential experiments based on scattering scanning near-field optical microscopy (s-SNOM) showing how to extract the GP reflectance from s-SNOM images. |
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