Analysis of nanostructured porous films by measurement of adsorption isotherms with optical fiber and ellipsometry
An optical method to determine the nanostructure and the morphology of porous thin films is presented. This procedure is based on the response of a side-polished optical fiber with the film under study, when an adsorption-desorption cycle is carried out. Spectroscopic ellipsometry provides additiona...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2002 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/59213 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/59213 |
| Access Level: | acceso abierto |
| Palabra clave: | 535 Principal Refractive-Indexes Thin-Films Titanium Dioxide Porosity Oxide Óptica (Física) 2209.19 Óptica Física |
| Sumario: | An optical method to determine the nanostructure and the morphology of porous thin films is presented. This procedure is based on the response of a side-polished optical fiber with the film under study, when an adsorption-desorption cycle is carried out. Spectroscopic ellipsometry provides additional information about the optical properties and adsorption behavior of the film. Pore size distribution, anisotropy, and inhomogeneity of films can be determined by use of these two complementary techniques. To check the performances and suitability of the optical method, we have characterized a typical porous material: a TiO_2 film deposited by evaporation. Water vapor has been used for the adsorption cycles. The well-known columnar structure of the evaporated TiO_2 has been evidenced, and the relation between the nanostructure and the optical properties of the film is showed. |
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