Inverse scattering for monochromatic phaseless measurements

An inverse method and measurement setup for profile and constitutive parameters reconstruction from monochromatic phaseless information is presented. The method is based on the minimization of a cost function that relates the measured field with the one scattered by a model of the object under test...

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Autores: Álvarez López, Yuri|||0000-0003-3625-4515, García Fernández, María|||0000-0001-8935-1912, Poli, Lorenzo, García González, Cebrián|||0000-0002-7054-3567, Rocca, Paolo, Massa, Andrea, Las Heras Andrés, Fernando Luis|||0000-0001-7959-2114
Tipo de recurso: artículo
Fecha de publicación:2016
País:España
Institución:Universidad de Oviedo (UNIOVI)
Repositorio:RUO. Repositorio Institucional de la Universidad de Oviedo
Idioma:inglés
OAI Identifier:oai:digibuo.uniovi.es:10651/38979
Acceso en línea:http://hdl.handle.net/10651/38979
https://dx.doi.org/10.1109/TIM.2016.2615478
Access Level:acceso abierto
Palabra clave:Inverse scattering
Imaging
Dielectric
Permittivity
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spelling Inverse scattering for monochromatic phaseless measurementsÁlvarez López, Yuri|||0000-0003-3625-4515García Fernández, María|||0000-0001-8935-1912Poli, LorenzoGarcía González, Cebrián|||0000-0002-7054-3567 Rocca, PaoloMassa, AndreaLas Heras Andrés, Fernando Luis|||0000-0001-7959-2114Inverse scatteringImagingDielectricPermittivityAn inverse method and measurement setup for profile and constitutive parameters reconstruction from monochromatic phaseless information is presented. The method is based on the minimization of a cost function that relates the measured field with the one scattered by a model of the object under test (OUT), where the position, contour, and constitutive parameters are the unknowns. As a result, phaseless information is directly related to the inverse problem unknowns, thus avoiding the need of an intermediate phase retrieval step. Due to the nonlinear nature of the cost function, global optimization techniques, such as the particle swarm optimization and differential evolution algorithms, have been considered for cost function minimization. An exhaustive analysis of the cost function behavior as a function of the electric size of the OUT is presented, discussing the optimal OUT size where the proposed methodology provides accurate profile and constitutive parameters reconstruction. The proposed methodology is conceived to use it together with a simple, low-cost measurement setup for fast characterization of perfect electric conductor and dielectric objects. Measurement examples are presented aiming to prove the feasibility of the described measurement setupCampus de Excelencia Internacional - Ayudas de Movilidad de Excelencia Banco Santander 2015. Ministerio de Economia y Competitividad - Gobierno de España: TEC 2014-54005-P (MIRIIEM) y MINECO-15-TEC2014-55290-JIN (PORTEMVISION). Gobierno del Principado de Asturias PCTI 2013-2017, FC-15-GRUPIN14-114IEEE20162016-01-01journal articlehttp://purl.org/coar/resource_type/c_6501AMhttp://purl.org/coar/version/c_ab4af688f83e57aainfo:eu-repo/semantics/articlehttp://hdl.handle.net/10651/38979https://dx.doi.org/10.1109/TIM.2016.2615478reponame:RUO. Repositorio Institucional de la Universidad de Oviedoinstname:Universidad de Oviedo (UNIOVI)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:digibuo.uniovi.es:10651/389792026-06-07T06:38:51Z
dc.title.none.fl_str_mv Inverse scattering for monochromatic phaseless measurements
title Inverse scattering for monochromatic phaseless measurements
spellingShingle Inverse scattering for monochromatic phaseless measurements
Álvarez López, Yuri|||0000-0003-3625-4515
Inverse scattering
Imaging
Dielectric
Permittivity
title_short Inverse scattering for monochromatic phaseless measurements
title_full Inverse scattering for monochromatic phaseless measurements
title_fullStr Inverse scattering for monochromatic phaseless measurements
title_full_unstemmed Inverse scattering for monochromatic phaseless measurements
title_sort Inverse scattering for monochromatic phaseless measurements
dc.creator.none.fl_str_mv Álvarez López, Yuri|||0000-0003-3625-4515
García Fernández, María|||0000-0001-8935-1912
Poli, Lorenzo
García González, Cebrián|||0000-0002-7054-3567
Rocca, Paolo
Massa, Andrea
Las Heras Andrés, Fernando Luis|||0000-0001-7959-2114
author Álvarez López, Yuri|||0000-0003-3625-4515
author_facet Álvarez López, Yuri|||0000-0003-3625-4515
García Fernández, María|||0000-0001-8935-1912
Poli, Lorenzo
García González, Cebrián|||0000-0002-7054-3567
Rocca, Paolo
Massa, Andrea
Las Heras Andrés, Fernando Luis|||0000-0001-7959-2114
author_role author
author2 García Fernández, María|||0000-0001-8935-1912
Poli, Lorenzo
García González, Cebrián|||0000-0002-7054-3567
Rocca, Paolo
Massa, Andrea
Las Heras Andrés, Fernando Luis|||0000-0001-7959-2114
author2_role author
author
author
author
author
author
dc.subject.none.fl_str_mv Inverse scattering
Imaging
Dielectric
Permittivity
topic Inverse scattering
Imaging
Dielectric
Permittivity
description An inverse method and measurement setup for profile and constitutive parameters reconstruction from monochromatic phaseless information is presented. The method is based on the minimization of a cost function that relates the measured field with the one scattered by a model of the object under test (OUT), where the position, contour, and constitutive parameters are the unknowns. As a result, phaseless information is directly related to the inverse problem unknowns, thus avoiding the need of an intermediate phase retrieval step. Due to the nonlinear nature of the cost function, global optimization techniques, such as the particle swarm optimization and differential evolution algorithms, have been considered for cost function minimization. An exhaustive analysis of the cost function behavior as a function of the electric size of the OUT is presented, discussing the optimal OUT size where the proposed methodology provides accurate profile and constitutive parameters reconstruction. The proposed methodology is conceived to use it together with a simple, low-cost measurement setup for fast characterization of perfect electric conductor and dielectric objects. Measurement examples are presented aiming to prove the feasibility of the described measurement setup
publishDate 2016
dc.date.none.fl_str_mv 2016
2016-01-01
dc.type.none.fl_str_mv journal article
http://purl.org/coar/resource_type/c_6501
AM
http://purl.org/coar/version/c_ab4af688f83e57aa
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10651/38979
https://dx.doi.org/10.1109/TIM.2016.2615478
url http://hdl.handle.net/10651/38979
https://dx.doi.org/10.1109/TIM.2016.2615478
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv IEEE
publisher.none.fl_str_mv IEEE
dc.source.none.fl_str_mv reponame:RUO. Repositorio Institucional de la Universidad de Oviedo
instname:Universidad de Oviedo (UNIOVI)
instname_str Universidad de Oviedo (UNIOVI)
reponame_str RUO. Repositorio Institucional de la Universidad de Oviedo
collection RUO. Repositorio Institucional de la Universidad de Oviedo
repository.name.fl_str_mv
repository.mail.fl_str_mv
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