Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy

Transient microscopy is of vital importance in understanding the dynamics of optical excited states in optoelectronic materials, as it allows for a direct visualization of the movement of energy carriers in space and time. Important information on trap-state dynamics can be obtained using this techn...

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Detalles Bibliográficos
Autores: Seitz, Michael, Meléndez Schofield, Marc, Alcázar Cano, Nerea, Congreve, Daniel N., Delgado Buscalioni, Rafael, Prins, Ferry
Tipo de recurso: artículo
Fecha de publicación:2021
País:España
Institución:Universidad Autónoma de Madrid
Repositorio:Biblos-e Archivo. Repositorio Institucional de la UAM
Idioma:inglés
OAI Identifier:oai:repositorio.uam.es:10486/727700
Acceso en línea:https://hdl.handle.net/10486/727700
https://dx.doi.org/10.1002/adom.202001875
Access Level:acceso abierto
Palabra clave:Excitons
metal halides
optoelectronic devices
perovskite
photoluminescence
Física
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spelling Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence MicroscopySeitz, MichaelMeléndez Schofield, MarcAlcázar Cano, NereaCongreve, Daniel N.Delgado Buscalioni, RafaelPrins, FerryExcitonsmetal halidesoptoelectronic devicesperovskitephotoluminescenceFísicaTransient microscopy is of vital importance in understanding the dynamics of optical excited states in optoelectronic materials, as it allows for a direct visualization of the movement of energy carriers in space and time. Important information on trap-state dynamics can be obtained using this technique, typically observed as a slow-down of energy transport as carriers are trapped at defect sites. To date, however, studies of the trap-state dynamics have been mostly limited to phenomenological descriptions of the early time-dynamics. Here, it is shown how long-acquisitiontime transient photoluminescence microscopy can be used to provide a detailed map of the trapstate landscape in 2D perovskites, in particular when used in combination with transient spectroscopy. An anomalous evolution of the studied exciton distribution is observed, which cannot be explained with existing models for trap limited exciton transport that only account for a single trap type. Instead, using a continuous diffusion model and performing Brownian dynamics simulations, it is shown that this behavior can be explained by accounting for a distinct distribution of traps in this material. These results highlight the value of transient microscopy as a complementary tool to more common transient spectroscopy techniques in the characterization of excited state dynamics in semiconductorsThis work has been supported by the Spanish Ministry of Economy and Competitiveness through the “María de Maeztu” Program for Units of Excellence in R&D (MDM-2014-0377). M.S. acknowledges the financial support through a Doc.Mobility Fellowship from the Swiss National Science Foundation (SNF) with Grant No. 187676. In addition, M.S. acknowledges the financial support of a fellowship from “la Caixa” Foundation (ID 100010434). The fellowship code is LCF/BQ/ IN17/11620040. M.S. has received funding from the European Union’s Horizon 2020 research and innovation program under the Marie Skłodowska-Curie Grant Agreement No. 713673. F.P. acknowledges support from the Spanish Ministry for Science, Innovation, and Universities through the state program (PGC2018-097236-A-I00) and through the Ramón y Cajal program (RYC-2017-23253), as well as the Comunidad de Madrid Talent Program for Experienced Researchers (2016-T1/IND-1209). M.M., N.A.-C., and R.D.-B. acknowledge support from the Spanish Ministry of Economy, Industry and Competitiveness through Grant FIS2017-86007-C3-1-P (AEI/FEDER, EU). D.N.C. acknowledges the support of the Rowland Fellowship at the Rowland Institute at Harvard UniversityJohn Wiley and Sons IncFacultad de CienciasDepartamento de Física Teórica de la Materia CondensadaDepartamento de Física de la Materia CondensadaAgencia Estatal de InvestigaciónEuropean Commission20212021-02-04research articlehttp://purl.org/coar/resource_type/c_2df8fbb1CVoRhttp://purl.org/coar/version/c_e19f295774971610info:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/10486/727700https://dx.doi.org/10.1002/adom.202001875reponame:Biblos-e Archivo. Repositorio Institucional de la UAMinstname:Universidad Autónoma de MadridInglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:repositorio.uam.es:10486/7277002026-06-23T12:46:27Z
dc.title.none.fl_str_mv Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy
title Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy
spellingShingle Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy
Seitz, Michael
Excitons
metal halides
optoelectronic devices
perovskite
photoluminescence
Física
title_short Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy
title_full Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy
title_fullStr Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy
title_full_unstemmed Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy
title_sort Mapping the Trap-State Landscape in 2D Metal-Halide Perovskites Using Transient Photoluminescence Microscopy
dc.creator.none.fl_str_mv Seitz, Michael
Meléndez Schofield, Marc
Alcázar Cano, Nerea
Congreve, Daniel N.
Delgado Buscalioni, Rafael
Prins, Ferry
author Seitz, Michael
author_facet Seitz, Michael
Meléndez Schofield, Marc
Alcázar Cano, Nerea
Congreve, Daniel N.
Delgado Buscalioni, Rafael
Prins, Ferry
author_role author
author2 Meléndez Schofield, Marc
Alcázar Cano, Nerea
Congreve, Daniel N.
Delgado Buscalioni, Rafael
Prins, Ferry
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Facultad de Ciencias
Departamento de Física Teórica de la Materia Condensada
Departamento de Física de la Materia Condensada
Agencia Estatal de Investigación
European Commission
dc.subject.none.fl_str_mv Excitons
metal halides
optoelectronic devices
perovskite
photoluminescence
Física
topic Excitons
metal halides
optoelectronic devices
perovskite
photoluminescence
Física
description Transient microscopy is of vital importance in understanding the dynamics of optical excited states in optoelectronic materials, as it allows for a direct visualization of the movement of energy carriers in space and time. Important information on trap-state dynamics can be obtained using this technique, typically observed as a slow-down of energy transport as carriers are trapped at defect sites. To date, however, studies of the trap-state dynamics have been mostly limited to phenomenological descriptions of the early time-dynamics. Here, it is shown how long-acquisitiontime transient photoluminescence microscopy can be used to provide a detailed map of the trapstate landscape in 2D perovskites, in particular when used in combination with transient spectroscopy. An anomalous evolution of the studied exciton distribution is observed, which cannot be explained with existing models for trap limited exciton transport that only account for a single trap type. Instead, using a continuous diffusion model and performing Brownian dynamics simulations, it is shown that this behavior can be explained by accounting for a distinct distribution of traps in this material. These results highlight the value of transient microscopy as a complementary tool to more common transient spectroscopy techniques in the characterization of excited state dynamics in semiconductors
publishDate 2021
dc.date.none.fl_str_mv 2021
2021-02-04
dc.type.none.fl_str_mv research article
http://purl.org/coar/resource_type/c_2df8fbb1
CVoR
http://purl.org/coar/version/c_e19f295774971610
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://hdl.handle.net/10486/727700
https://dx.doi.org/10.1002/adom.202001875
url https://hdl.handle.net/10486/727700
https://dx.doi.org/10.1002/adom.202001875
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv John Wiley and Sons Inc
publisher.none.fl_str_mv John Wiley and Sons Inc
dc.source.none.fl_str_mv reponame:Biblos-e Archivo. Repositorio Institucional de la UAM
instname:Universidad Autónoma de Madrid
instname_str Universidad Autónoma de Madrid
reponame_str Biblos-e Archivo. Repositorio Institucional de la UAM
collection Biblos-e Archivo. Repositorio Institucional de la UAM
repository.name.fl_str_mv
repository.mail.fl_str_mv
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