Cita APA

Rafí, J. M., Mercha, A., Simoen, E., Hayama, K., & Claeys, C. (2004). Impact of radiation-induced back-channel leakage and back-gate bias on drain current transients of thin-gate-oxide partially depleted silicon-on-insulator n-channel metal-oxide-semiconductor field-effect transistors.

Citación estilo Chicago

Rafí, Joan Marc, Abdelkarim Mercha, Eddy Simoen, Kiyoteru Hayama, y C. Claeys. Impact of Radiation-induced Back-channel Leakage and Back-gate Bias On Drain Current Transients of Thin-gate-oxide Partially Depleted Silicon-on-insulator N-channel Metal-oxide-semiconductor Field-effect Transistors. 2004.

Cita MLA

Rafí, Joan Marc, et al. Impact of Radiation-induced Back-channel Leakage and Back-gate Bias On Drain Current Transients of Thin-gate-oxide Partially Depleted Silicon-on-insulator N-channel Metal-oxide-semiconductor Field-effect Transistors. 2004.