IGBT-gating failure effect on a fault-tolerant predictive current-controlled five-phase induction motor drive

Multiphase machine drives are gaining importance in high-reliability applications due to their fault-tolerance capability and their ability to cope with the postfault operation without any extra electronic components. Predictive current controllers have been recently proposed for managing postfault...

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Detalhes bibliográficos
Autores: Guzmán, Hugo, Barrero, Federico, Durán, Mario J.
Formato: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2015
País:España
Recursos:Universidad de Sevilla (US)
Repositorio:idUS. Depósito de Investigación de la Universidad de Sevilla
OAI Identifier:oai:idus.us.es:11441/34896
Acesso em linha:http://hdl.handle.net/11441/34896
https://doi.org/10.1109/TIE.2014.2331019
Access Level:acceso abierto
Palavra-chave:Multiphase drives
Post-fault operation
Fault-tolerance
IGBT gating fault
Free-wheeling diodes
Predictive controllers
Descrição
Resumo:Multiphase machine drives are gaining importance in high-reliability applications due to their fault-tolerance capability and their ability to cope with the postfault operation without any extra electronic components. Predictive current controllers have been recently proposed for managing postfault operation of these drives when an open-phase fault is considered. However, the faulty situation assumes zero stator current while freewheeling diodes can continue conducting in a noncontrolled mode. This work analyzes the postfault operation of the five-phase drive when the freewheeling diodes of the faulty phase are still conducting. Experimental results are provided using a conventional insulated-gate bipolar transistor (IGBT)-based multiphase power converter to quantify the effect of the freewheeling diodes, when an IGBT-gating fault occurs, on the model-based predictive current-controlled drive.