An enhanced resolution brightness temperature product for future conical scanning microwave radiometers
An enhanced spatial resolution brightness temperature product is proposed for future conical scan microwave radiometers. The technique is developed for Copernicus Imaging Microwave Radiometer (CIMR) measurements that are simulated using the CIMR antenna pattern at the L-band and the measurement geom...
| Autores: | , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2022 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/359691 |
| Acceso en línea: | https://hdl.handle.net/2117/359691 https://dx.doi.org/10.1109/TGRS.2021.3109376 |
| Access Level: | acceso abierto |
| Palabra clave: | Radiometers Microwave detectors Inverse problem Microwave radiometer Multichannel data fusion Resolution enhancement Radiòmetres Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Teledetecció |
| Sumario: | An enhanced spatial resolution brightness temperature product is proposed for future conical scan microwave radiometers. The technique is developed for Copernicus Imaging Microwave Radiometer (CIMR) measurements that are simulated using the CIMR antenna pattern at the L-band and the measurement geometry proposed in the Phase A study led by Airbus. An inverse antenna pattern reconstruction method is proposed. Reconstructions are obtained using two CIMR configurations, namely, using measurements collected at L-band by the forward (FWD) scans only, and combining forward and backward (FWD+BWD) scans. Two spatial grids are adopted, namely, 3 km x 3 km and 36 km x 36 km. Simulation results, referred to synthetic and realistic reference brightness fields, demonstrate the soundness of the proposed scheme that provides brightness temperature fields reconstructed at a spatial resolution up to ~ 1.9 times finer than the measured field when using the FWD+BWD combination. |
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