Automatic wavefront measurement technique using a computer display and a charge-coupled device camera

A simple and fully automated technique for wavefront measurement is presented. This technique is based on the use of a computer display (for example, a CRT or a thin film transistor (TFT) monitor) to generate intensity-modulated patterns from which images are taken by a CCD camera. When a phase obje...

Descripción completa

Detalles Bibliográficos
Autores: Canabal Boutureira, Héctor Alfonso, Alonso Fernández, José
Tipo de recurso: artículo
Fecha de publicación:2002
País:España
Institución:Universidad Complutense de Madrid (UCM)
Repositorio:Docta Complutense
Idioma:inglés
OAI Identifier:oai:docta.ucm.es:20.500.14352/117588
Acceso en línea:https://hdl.handle.net/20.500.14352/117588
Access Level:acceso abierto
Palabra clave:Wavefront measurement
Phase shift
Phase gradient
Ophthalmic lens
Moire deflectometry
Phase unwrapping
Ciencias
Óptica (Física)
Óptica oftálmica
Óptica geométrica e instrumental
Técnicas de la imagen
2209 Óptica
2209.90 Tratamiento Digital. Imágenes
id ES_9cd44d35200084cbd6bb92036690fc2c
oai_identifier_str oai:docta.ucm.es:20.500.14352/117588
network_acronym_str ES
network_name_str España
repository_id_str
spelling Automatic wavefront measurement technique using a computer display and a charge-coupled device cameraCanabal Boutureira, Héctor AlfonsoAlonso Fernández, JoséWavefront measurementPhase shiftPhase gradientOphthalmic lensMoire deflectometryPhase unwrappingCienciasÓptica (Física)Óptica oftálmicaÓptica geométrica e instrumentalTécnicas de la imagen2209 Óptica2209.90 Tratamiento Digital. ImágenesA simple and fully automated technique for wavefront measurement is presented. This technique is based on the use of a computer display (for example, a CRT or a thin film transistor (TFT) monitor) to generate intensity-modulated patterns from which images are taken by a CCD camera. When a phase object is located between the display and the camera, the intensity patterns are distorted. By measuring this distortion, the gradients of the phase change caused by the object can be obtained. To simplify the data analysis it is practical to display on the monitor a grating with a sinusoidal intensity profile, which enables the use of standard fringe pattern analysis techniques. We use phase- shifting and temporal phase-unwrapping techniques. The use of a computer display for fringe (or grating) generation leads to the possibility of adjusting the sensibility of the measurement in function of the phase variation of the object to test and avoiding the problems of having a fixed grating period (as in the case of Ronchi rulings or printed gratings) or using mechanical parts to change them. Experimental measurements of two different ophthalmic lenses with local distributions of focal lengths prove the versatility of this method for optical testing. The method is simple, flexible, and low cost, yet it yields a remarkably high SNR. Compared with other techniques such as interferometry and moire deflecto- metry, the setup is cheaper and far easier to align.Society of Photo-Optical Instrumentation Engineers (SPIE)Universidad Complutense de Madrid20022002-04-0120022002-04-01journal articlehttp://purl.org/coar/resource_type/c_6501VoRhttp://purl.org/coar/version/c_970fb48d4fbd8a85info:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/20.500.14352/117588reponame:Docta Complutenseinstname:Universidad Complutense de Madrid (UCM)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:docta.ucm.es:20.500.14352/1175882026-06-02T12:44:21Z
dc.title.none.fl_str_mv Automatic wavefront measurement technique using a computer display and a charge-coupled device camera
title Automatic wavefront measurement technique using a computer display and a charge-coupled device camera
spellingShingle Automatic wavefront measurement technique using a computer display and a charge-coupled device camera
Canabal Boutureira, Héctor Alfonso
Wavefront measurement
Phase shift
Phase gradient
Ophthalmic lens
Moire deflectometry
Phase unwrapping
Ciencias
Óptica (Física)
Óptica oftálmica
Óptica geométrica e instrumental
Técnicas de la imagen
2209 Óptica
2209.90 Tratamiento Digital. Imágenes
title_short Automatic wavefront measurement technique using a computer display and a charge-coupled device camera
title_full Automatic wavefront measurement technique using a computer display and a charge-coupled device camera
title_fullStr Automatic wavefront measurement technique using a computer display and a charge-coupled device camera
title_full_unstemmed Automatic wavefront measurement technique using a computer display and a charge-coupled device camera
title_sort Automatic wavefront measurement technique using a computer display and a charge-coupled device camera
dc.creator.none.fl_str_mv Canabal Boutureira, Héctor Alfonso
Alonso Fernández, José
author Canabal Boutureira, Héctor Alfonso
author_facet Canabal Boutureira, Héctor Alfonso
Alonso Fernández, José
author_role author
author2 Alonso Fernández, José
author2_role author
dc.contributor.none.fl_str_mv Universidad Complutense de Madrid
dc.subject.none.fl_str_mv Wavefront measurement
Phase shift
Phase gradient
Ophthalmic lens
Moire deflectometry
Phase unwrapping
Ciencias
Óptica (Física)
Óptica oftálmica
Óptica geométrica e instrumental
Técnicas de la imagen
2209 Óptica
2209.90 Tratamiento Digital. Imágenes
topic Wavefront measurement
Phase shift
Phase gradient
Ophthalmic lens
Moire deflectometry
Phase unwrapping
Ciencias
Óptica (Física)
Óptica oftálmica
Óptica geométrica e instrumental
Técnicas de la imagen
2209 Óptica
2209.90 Tratamiento Digital. Imágenes
description A simple and fully automated technique for wavefront measurement is presented. This technique is based on the use of a computer display (for example, a CRT or a thin film transistor (TFT) monitor) to generate intensity-modulated patterns from which images are taken by a CCD camera. When a phase object is located between the display and the camera, the intensity patterns are distorted. By measuring this distortion, the gradients of the phase change caused by the object can be obtained. To simplify the data analysis it is practical to display on the monitor a grating with a sinusoidal intensity profile, which enables the use of standard fringe pattern analysis techniques. We use phase- shifting and temporal phase-unwrapping techniques. The use of a computer display for fringe (or grating) generation leads to the possibility of adjusting the sensibility of the measurement in function of the phase variation of the object to test and avoiding the problems of having a fixed grating period (as in the case of Ronchi rulings or printed gratings) or using mechanical parts to change them. Experimental measurements of two different ophthalmic lenses with local distributions of focal lengths prove the versatility of this method for optical testing. The method is simple, flexible, and low cost, yet it yields a remarkably high SNR. Compared with other techniques such as interferometry and moire deflecto- metry, the setup is cheaper and far easier to align.
publishDate 2002
dc.date.none.fl_str_mv 2002
2002-04-01
2002
2002-04-01
dc.type.none.fl_str_mv journal article
http://purl.org/coar/resource_type/c_6501
VoR
http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://hdl.handle.net/20.500.14352/117588
url https://hdl.handle.net/20.500.14352/117588
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Society of Photo-Optical Instrumentation Engineers (SPIE)
publisher.none.fl_str_mv Society of Photo-Optical Instrumentation Engineers (SPIE)
dc.source.none.fl_str_mv reponame:Docta Complutense
instname:Universidad Complutense de Madrid (UCM)
instname_str Universidad Complutense de Madrid (UCM)
reponame_str Docta Complutense
collection Docta Complutense
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869414691560751104
score 15,811543

Similares en LA Referencia