Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films

The thermal imaging of surfaces with microscale spatial resolution over micro-sized areas remains a challenging and time-consuming task. Surface thermal imaging is a very important characterization tool in mechanical engineering, microelectronics, chemical process engineering, optics, microfluidics,...

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Autores: Chávez-Angel, Emigdio, Ng, Ryan C., Sandell, Susanne, He, Jianying, Castro-Álvarez, Alejandro, Sotomayor Torres, C. M., Kreuzer, Martin
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2023
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/336068
Acceso en línea:http://hdl.handle.net/10261/336068
https://api.elsevier.com/content/abstract/scopus_id/85147939451
Access Level:acceso abierto
Palabra clave:FTIR polymer
FTIR thermometry
Machine learning
Synchrotron radiation
Temperature dependence
Thermal imaging
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network_name_str España
repository_id_str
dc.title.none.fl_str_mv Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
title Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
spellingShingle Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
Chávez-Angel, Emigdio
FTIR polymer
FTIR thermometry
Machine learning
Synchrotron radiation
Temperature dependence
Thermal imaging
title_short Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
title_full Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
title_fullStr Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
title_full_unstemmed Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
title_sort Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
dc.creator.none.fl_str_mv Chávez-Angel, Emigdio
Ng, Ryan C.
Sandell, Susanne
He, Jianying
Castro-Álvarez, Alejandro
Sotomayor Torres, C. M.
Kreuzer, Martin
author Chávez-Angel, Emigdio
author_facet Chávez-Angel, Emigdio
Ng, Ryan C.
Sandell, Susanne
He, Jianying
Castro-Álvarez, Alejandro
Sotomayor Torres, C. M.
Kreuzer, Martin
author_role author
author2 Ng, Ryan C.
Sandell, Susanne
He, Jianying
Castro-Álvarez, Alejandro
Sotomayor Torres, C. M.
Kreuzer, Martin
author2_role author
author
author
author
author
author
dc.contributor.none.fl_str_mv European Commission
Generalitat de Catalunya
Ministerio de Ciencia, Innovación y Universidades (España)
Agencia Estatal de Investigación (España)
Research Council of Norway
Fondo Nacional de Desarrollo Científico y Tecnológico (Chile)
Chávez-Angel, Emigdio [0000-0002-9783-0806]
Ng, Ryan C. [0000-0002-0527-9130]
Sandell, Susanne [0000-0003-1906-6790]
He, Jianying [0000-0001-8485-7893]
Castro-Álvarez, Alejandro [0000-0001-8360-8027]
Sotomayor Torres, C. M. [0000-0001-9986-2716]
Kreuzer, Martin [0000-0002-7305-5016]
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv FTIR polymer
FTIR thermometry
Machine learning
Synchrotron radiation
Temperature dependence
Thermal imaging
topic FTIR polymer
FTIR thermometry
Machine learning
Synchrotron radiation
Temperature dependence
Thermal imaging
description The thermal imaging of surfaces with microscale spatial resolution over micro-sized areas remains a challenging and time-consuming task. Surface thermal imaging is a very important characterization tool in mechanical engineering, microelectronics, chemical process engineering, optics, microfluidics, and biochemistry processing, among others. Within the realm of electronic circuits, this technique has significant potential for investigating hot spots, power densities, and monitoring heat distributions in complementary metal-oxide-semiconductor (CMOS) platforms. We present a new technique for remote non-invasive, contactless thermal field mapping using synchrotron radiation-based Fourier-transform infrared microspectroscopy. We demonstrate a spatial resolution better than 10 um over areas on the order of 12,000 um2 measured in a polymeric thin film on top of CaF2 substrates. Thermal images were obtained from infrared spectra of poly(methyl methacrylate) thin films heated with a wire. The temperature dependence of the collected infrared spectra was analyzed via linear regression and machine learning algorithms, namely random forest and k-nearest neighbor algorithms. This approach speeds up signal analysis and allows for the generation of hyperspectral temperature maps. The results here highlight the potential of infrared absorbance to serve as a remote method for the quantitative determination of heat distribution, thermal properties, and the existence of hot spots, with implications in CMOS technologies and other electronic devices.
publishDate 2023
dc.date.none.fl_str_mv 2023
2023
2023
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Publisher's version
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/336068
https://api.elsevier.com/content/abstract/scopus_id/85147939451
url http://hdl.handle.net/10261/336068
https://api.elsevier.com/content/abstract/scopus_id/85147939451
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv #PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
info:eu-repo/grantAgreement/EC/H2020/885689
info:eu-repo/grantAgreement/EC/H2020/897148
Chávez-Angel, Emigdio; Ng, Ryan C.; Sandell, Susanne; He, Jianying; Castro-Álvarez, Alejandro; Sotomayor Torres, C. M.; Kreuzer, Martin; 2023; Supplementary Materials Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films [Dataset]; Multidisciplinary Digital Publishing Institute; https://doi.org/10.3390/polym15030536
https://doi.org/10.3390/polym15030536
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
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dc.publisher.none.fl_str_mv Multidisciplinary Digital Publishing Institute
publisher.none.fl_str_mv Multidisciplinary Digital Publishing Institute
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
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spelling Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin FilmsChávez-Angel, EmigdioNg, Ryan C.Sandell, SusanneHe, JianyingCastro-Álvarez, AlejandroSotomayor Torres, C. M.Kreuzer, MartinFTIR polymerFTIR thermometryMachine learningSynchrotron radiationTemperature dependenceThermal imagingThe thermal imaging of surfaces with microscale spatial resolution over micro-sized areas remains a challenging and time-consuming task. Surface thermal imaging is a very important characterization tool in mechanical engineering, microelectronics, chemical process engineering, optics, microfluidics, and biochemistry processing, among others. Within the realm of electronic circuits, this technique has significant potential for investigating hot spots, power densities, and monitoring heat distributions in complementary metal-oxide-semiconductor (CMOS) platforms. We present a new technique for remote non-invasive, contactless thermal field mapping using synchrotron radiation-based Fourier-transform infrared microspectroscopy. We demonstrate a spatial resolution better than 10 um over areas on the order of 12,000 um2 measured in a polymeric thin film on top of CaF2 substrates. Thermal images were obtained from infrared spectra of poly(methyl methacrylate) thin films heated with a wire. The temperature dependence of the collected infrared spectra was analyzed via linear regression and machine learning algorithms, namely random forest and k-nearest neighbor algorithms. This approach speeds up signal analysis and allows for the generation of hyperspectral temperature maps. The results here highlight the potential of infrared absorbance to serve as a remote method for the quantitative determination of heat distribution, thermal properties, and the existence of hot spots, with implications in CMOS technologies and other electronic devices.We acknowledge the support from the project LEIT funded by the European Research Council, H2020 Grant Agreement No. 885689. ICN2 is supported by the Severo Ochoa program from the Spanish Research Agency (AEI, grant no. SEV-2017-0706) and by the CERCA Programme/Generalitat de Catalunya. R.C.N. acknowledges funding from the EU-H2020 research and innovation program under the Marie Sklodowska Curie Individual Fellowship (Grant No. 897148). The Research Council of Norway is acknowledged for the support to NorFab (Grant No. 295864) and the HEFACE project (Grant No. 251068). A.C.-A. acknowledges the support from the Fondecyt Iniciación 11200620.Peer reviewedMultidisciplinary Digital Publishing InstituteEuropean CommissionGeneralitat de CatalunyaMinisterio de Ciencia, Innovación y Universidades (España)Agencia Estatal de Investigación (España)Research Council of NorwayFondo Nacional de Desarrollo Científico y Tecnológico (Chile)Chávez-Angel, Emigdio [0000-0002-9783-0806]Ng, Ryan C. [0000-0002-0527-9130]Sandell, Susanne [0000-0003-1906-6790]He, Jianying [0000-0001-8485-7893]Castro-Álvarez, Alejandro [0000-0001-8360-8027]Sotomayor Torres, C. M. [0000-0001-9986-2716]Kreuzer, Martin [0000-0002-7305-5016]Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202320232023info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Publisher's versioninfo:eu-repo/semantics/publishedVersionapplication/pdfhttp://hdl.handle.net/10261/336068https://api.elsevier.com/content/abstract/scopus_id/85147939451reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglés#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#info:eu-repo/grantAgreement/EC/H2020/885689info:eu-repo/grantAgreement/EC/H2020/897148Chávez-Angel, Emigdio; Ng, Ryan C.; Sandell, Susanne; He, Jianying; Castro-Álvarez, Alejandro; Sotomayor Torres, C. M.; Kreuzer, Martin; 2023; Supplementary Materials Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films [Dataset]; Multidisciplinary Digital Publishing Institute; https://doi.org/10.3390/polym15030536https://doi.org/10.3390/polym15030536Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/3360682026-05-22T06:33:51Z
score 15.811543

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