Quasi-TM MoL/MoM approach for computing the transmission-line parameters of lossy lines
This paper presents a quasi-TM approach for the fundamental mode of transmission lines with semiconductor substrates and nonperfect metallic conductors. The approach has allowed us to develop a transmission-line model by properly defining frequency-dependent parameters in terms of the quasi-static e...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2006 |
| País: | España |
| Institución: | Universidad de Sevilla (US) |
| Repositorio: | idUS. Depósito de Investigación de la Universidad de Sevilla |
| OAI Identifier: | oai:idus.us.es:11441/97537 |
| Acceso en línea: | https://hdl.handle.net/11441/97537 https://doi.org/10.1109/TMTT.2005.860507 |
| Access Level: | acceso abierto |
| Palabra clave: | Conductor losses Coplanar waveguide (CPW) Metal–insulator–semiconductor (MIS) Method of lines (MoL) Microstrip Substrate losses Transmission-line model |
| Sumario: | This paper presents a quasi-TM approach for the fundamental mode of transmission lines with semiconductor substrates and nonperfect metallic conductors. The approach has allowed us to develop a transmission-line model by properly defining frequency-dependent parameters in terms of the quasi-static electric potential and the electric current density along the propagation direction in the line. The previous quasi-TM analysis avoids the involved numerical root finding process typical in full-wave analysis, and overcomes the limitations of the conventional quasi-TEM approach to account for the effects of the longitudinal currents present both in the lossy substrates and in the nonperfect conductors. The transmission-line parameters have been computed by a hybrid technique that combines the method of lines with the method of the moments (MoM). The total CPU effort has been considerably reduced thanks to the possibility of finding closed-form expressions for the reaction integrals appearing in the MoM. Comparisons with previous computed and measured results show the validity of the present model |
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