Magnetron sputtered a-SiOxNy thin films: A closed porous nanostructure with controlled optical and mechanical properties

were prepared by magnetron sputtering. Pores size, shape and distribution were evaluated by scanning electron microscopy and transmission electron microscopy. Raman and EELS analysis proved that the pores are filled with molecular nitrogen trapped during deposition. The mechanical properties evaluat...

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Detalhes bibliográficos
Autores: Fortio Godinho, Vanda Cristina, Rojas Ruiz, Teresa Cristina, Fernández Camacho, Asunción
Formato: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2012
País:España
Recursos:Universidad de Sevilla (US)
Repositorio:idUS. Depósito de Investigación de la Universidad de Sevilla
OAI Identifier:oai:idus.us.es:11441/74343
Acesso em linha:https://hdl.handle.net/11441/74343
https://doi.org/10.1016/j.micromeso.2011.08.018
Access Level:acceso abierto
Palavra-chave:Silicon oxynitride
Closed porosity
Tailored refractive index
Mechanical stability
Descrição
Resumo:were prepared by magnetron sputtering. Pores size, shape and distribution were evaluated by scanning electron microscopy and transmission electron microscopy. Raman and EELS analysis proved that the pores are filled with molecular nitrogen trapped during deposition. The mechanical properties evaluated by nanoindentation shows that the presence of closed nano-porosity does not compromise the mechanical integrity of these coatings. The introduction of closed porosity is shown as a good strategy for obtaining lower dielectric Amorphous silicon oxynitride coatings with similar composition and different closed porosity constant silicon oxynitride coatings with similar composition while keeping the good mechanical properties (∼13 GPa) characteristic of this type of coatings. The presence of close porosity gives also a good stability of coatings properties as compared to open porosity microstructures where gas phase in contact with the coatings can affect coatings properties.