Magnetization reversal and exchange bias effects in hard/soft ferromagnetic bilayers with orthogonal anisotropies

The magnetization reversal processes are discussed for exchange-coupled ferromagnetic hard/soft bilayers made from Co0.66Cr 0.22Pt0.12 (10 and 20 nm)/Ni (from 0 to 40 nm) films with out-of-plane and in-plane magnetic easy axes respectively, based on room temperature hysteresis loops and first-order...

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Detalles Bibliográficos
Autores: Navas, David, Torrejon, J., Béron, F., Redondo, C., Batallán, Francisco J., Toperverg, B.P., Devishvili, A., Sierra, B., Castaño, F., Pirota, K.R., Ross, Caroline A.
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2012
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/377236
Acceso en línea:http://hdl.handle.net/10261/377236
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84870407093&doi=10.1088%2f1367-2630%2f14%2f11%2f113001&partnerID=40&md5=2a1d21a4e591576168faaefd263c8374
Access Level:acceso abierto
Descripción
Sumario:The magnetization reversal processes are discussed for exchange-coupled ferromagnetic hard/soft bilayers made from Co0.66Cr 0.22Pt0.12 (10 and 20 nm)/Ni (from 0 to 40 nm) films with out-of-plane and in-plane magnetic easy axes respectively, based on room temperature hysteresis loops and first-order reversal curve analysis. On increasing the Ni layer thicknesses, the easy axis of the bilayer reorients from out-of-plane to in-plane. An exchange bias effect, consisting of a shift of the in-plane minor hysteresis loops along the field axis, was observed at room temperature after in-plane saturation. This effect was associated with specific ferromagnetic domain configurations experimentally determined by polarized neutron reflectivity. On the other hand, perpendicular exchange bias effect was revealed from the out-of-plane hysteresis loops and it was attributed to residual domains in the magnetically hard layer. © IOP Publishing and Deutsche Physikalische Gesellschaft.