Evaluation of the radar cross section of circular microstrip patches on anisotropic and chiral substrates
Galerkin's method in the Hankel transform domain (HTD) is applied to the determination of the radar cross section (RCS) of a circular microstrip patch printed on a substrate which may be an uniaxial anisotropic dielectric, a magnetized ferrite, or a chiral material. The results obtained for cir...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2001 |
| País: | España |
| Institución: | Universidad de Sevilla (US) |
| Repositorio: | idUS. Depósito de Investigación de la Universidad de Sevilla |
| OAI Identifier: | oai:idus.us.es:11441/99156 |
| Acceso en línea: | https://hdl.handle.net/11441/99156 https://doi.org/10.1109/8.964097 |
| Access Level: | acceso abierto |
| Palabra clave: | Complex media Microstrip patches Scattering |
| Sumario: | Galerkin's method in the Hankel transform domain (HTD) is applied to the determination of the radar cross section (RCS) of a circular microstrip patch printed on a substrate which may be an uniaxial anisotropic dielectric, a magnetized ferrite, or a chiral material. The results obtained for circular patches on magnetized ferrites show that the RCS of these patches can be substantially reduced in a tunable frequency band when a bias magnetic field is applied. It is also shown that the results obtained for the RCS of circular patches printed on chiral materials can be substantially different from those obtained when substrate chirality is ignored. |
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