Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy

Identification of energy-dissipation processes at the nanoscale is demonstrated by using amplitude-modulation atomic force microscopy. The variation of the energy dissipated on a surface by a vibrating tip as a function of its oscillation amplitude has a shape that singles out the dissipative proces...

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Detalles Bibliográficos
Autores: García García, Ricardo, Gómez Castro, Carlos Javier, Martínez Cuadrado, Nicolás Francisco, Patil, Shivprasad, Dietz, Christian, Magerle, R.
Tipo de recurso: artículo
Fecha de publicación:2006
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/18705
Acceso en línea:http://hdl.handle.net/10261/18705
Access Level:acceso abierto
Palabra clave:Atomic force microscopy
AM-AFM
Energy-dissipation
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spelling Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force MicroscopyGarcía García, RicardoGómez Castro, Carlos JavierMartínez Cuadrado, Nicolás FranciscoPatil, ShivprasadDietz, ChristianMagerle, R.Atomic force microscopyAM-AFMEnergy-dissipationIdentification of energy-dissipation processes at the nanoscale is demonstrated by using amplitude-modulation atomic force microscopy. The variation of the energy dissipated on a surface by a vibrating tip as a function of its oscillation amplitude has a shape that singles out the dissipative process occurring at the surface. The method is illustrated by calculating the energy-dissipation curves for surface energy hysteresis, long-range interfacial interactions and viscoelasticity. The method remains valid with independency of the amount of dissipated energy per cycle, from 0.1 to 50 eV. The agreement obtained between theory and experiments performed on silicon and polystyrene validates the method.This work was financially supported by the European Commission (FORCETOOL, NMP4-CT-2004-013684).Peer reviewedAmerican Physical Society200920092006info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_65011037847 bytesapplication/pdfhttp://hdl.handle.net/10261/18705reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Ingléshttp://link.aps.org/doi/10.1103/PhysRevLett.97.016103httlp://dx.doi.org/10.1103/PhysRevLett.97.016103info:eu-repo/semantics/openAccessoai:digital.csic.es:10261/187052026-05-22T06:33:51Z
dc.title.none.fl_str_mv Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy
title Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy
spellingShingle Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy
García García, Ricardo
Atomic force microscopy
AM-AFM
Energy-dissipation
title_short Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy
title_full Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy
title_fullStr Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy
title_full_unstemmed Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy
title_sort Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy
dc.creator.none.fl_str_mv García García, Ricardo
Gómez Castro, Carlos Javier
Martínez Cuadrado, Nicolás Francisco
Patil, Shivprasad
Dietz, Christian
Magerle, R.
author García García, Ricardo
author_facet García García, Ricardo
Gómez Castro, Carlos Javier
Martínez Cuadrado, Nicolás Francisco
Patil, Shivprasad
Dietz, Christian
Magerle, R.
author_role author
author2 Gómez Castro, Carlos Javier
Martínez Cuadrado, Nicolás Francisco
Patil, Shivprasad
Dietz, Christian
Magerle, R.
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Atomic force microscopy
AM-AFM
Energy-dissipation
topic Atomic force microscopy
AM-AFM
Energy-dissipation
description Identification of energy-dissipation processes at the nanoscale is demonstrated by using amplitude-modulation atomic force microscopy. The variation of the energy dissipated on a surface by a vibrating tip as a function of its oscillation amplitude has a shape that singles out the dissipative process occurring at the surface. The method is illustrated by calculating the energy-dissipation curves for surface energy hysteresis, long-range interfacial interactions and viscoelasticity. The method remains valid with independency of the amount of dissipated energy per cycle, from 0.1 to 50 eV. The agreement obtained between theory and experiments performed on silicon and polystyrene validates the method.
publishDate 2006
dc.date.none.fl_str_mv 2006
2009
2009
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/18705
url http://hdl.handle.net/10261/18705
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv http://link.aps.org/doi/10.1103/PhysRevLett.97.016103
httlp://dx.doi.org/10.1103/PhysRevLett.97.016103
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 1037847 bytes
application/pdf
dc.publisher.none.fl_str_mv American Physical Society
publisher.none.fl_str_mv American Physical Society
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
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repository.mail.fl_str_mv
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