Statistical Process Control based on Multivariate Image Analysis: A new proposal for monitoring and defect detection

The monitoring, fault detection and visualization of defects are a strategic issue for product quality. This paper presents a novel methodology based on the integration of textural Multivariate image analysis (MIA) and multivariate statistical process control (MSPC) for process monitoring. The propo...

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Detalles Bibliográficos
Autores: Prats-Montalbán, José Manuel|||0000-0001-6294-4486, Ferrer, Alberto|||0000-0001-7244-5947
Tipo de recurso: artículo
Fecha de publicación:2014
País:España
Institución:Universitat Politècnica de València (UPV)
Repositorio:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Idioma:inglés
OAI Identifier:oai:riunet.upv.es:10251/50302
Acceso en línea:https://riunet.upv.es/handle/10251/50302
Access Level:acceso abierto
Palabra clave:Multivariate Image Analysis (MIA)
ARL
Control charts
RSS image
T2 image
Wavelets
ESTADISTICA E INVESTIGACION OPERATIVA
Descripción
Sumario:The monitoring, fault detection and visualization of defects are a strategic issue for product quality. This paper presents a novel methodology based on the integration of textural Multivariate image analysis (MIA) and multivariate statistical process control (MSPC) for process monitoring. The proposed approach combines MIA and p-control charts, as well as T2 and RSS images for defect location and visualization. Simulated images of steel plates are used to illustrate the monitoring performance of it. Both approaches are also applied on real clover images.