Cita APA

Moralejo, B., Tejero, A., Hortelano Santos, V., Martínez Sacristán, Ó., González Delgado, M. Á., & Jiménez López, J. I. (2016). Defect recognition by means of light and electron probe techniques for the characterization of mc-Si wafers and solar cells.

Citación estilo Chicago

Moralejo, B., A. Tejero, Vanesa Hortelano Santos, Óscar Martínez Sacristán, Manuel Ángel González Delgado, y Juan Ignacio Jiménez López. Defect Recognition By Means of Light and Electron Probe Techniques for the Characterization of Mc-Si Wafers and Solar Cells. 2016.

Cita MLA

Moralejo, B., et al. Defect Recognition By Means of Light and Electron Probe Techniques for the Characterization of Mc-Si Wafers and Solar Cells. 2016.