Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy
The quantification of surface acoustic waves (SAWs) in LiNbO3 piezoelectric crystals by stroboscopic X-ray photoemission electron microscopy (XPEEM), with a temporal smearing below 80 ps and a spatial resolution below 100 nm, is reported. The contrast mechanism is the varying piezoelectric surface p...
| Autores: | , , , , , , , , |
|---|---|
| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2019 |
| País: | España |
| Institución: | Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya) |
| Repositorio: | Recercat. Dipósit de la Recerca de Catalunya |
| OAI Identifier: | oai:recercat.cat:2445/209552 |
| Acceso en línea: | https://hdl.handle.net/2445/209552 |
| Access Level: | acceso abierto |
| Palabra clave: | Ones acústiques de superfície Microscòpia electrònica Fotoemissió Acoustic surface waves Electron microscopy Photoemission |
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Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopyFoerster, MichaelStatuto, NahuelCasals Montserrat, BlaiHernández Mínguez, AlbertoFinizio, SimoneMandziak, AniaAballe, LucíaHernández Ferràs, JoanMacià Bros, FerranOnes acústiques de superfícieMicroscòpia electrònicaFotoemissióAcoustic surface wavesElectron microscopyPhotoemissionThe quantification of surface acoustic waves (SAWs) in LiNbO3 piezoelectric crystals by stroboscopic X-ray photoemission electron microscopy (XPEEM), with a temporal smearing below 80 ps and a spatial resolution below 100 nm, is reported. The contrast mechanism is the varying piezoelectric surface potential associated with the SAW phase. Thus, kinetic energy spectra of photoemitted secondary electrons measure directly the SAW electrical amplitude and allow for the quantification of the associated strain. The stroboscopic imaging combined with a deliberate detuning allows resolving and quantifying the respective standing and propagating components of SAWs from a superposition of waves. Furthermore, standing-wave components can also be imaged by low-energy electron microscopy (LEEM). Our method opens the door to studies that quantitatively correlate SAWs excitation with a variety of sample electronic, magnetic and chemical properties.Journal of Synchrotron Radiation2024202420192024info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersion10 p.application/pdfhttps://hdl.handle.net/2445/209552Articles publicats en revistes (Física Quàntica i Astrofísica)reponame:Recercat. Dipósit de la Recerca de Catalunyainstname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)InglésReproducció del document publicat a: https://doi.org/10.1107/S1600577518015370Journal of Synchrotron Radiation, 2019, vol. 26, p. 184-193https://doi.org/10.1107/S1600577518015370(c) Foerster, Michael. et al., 2023info:eu-repo/semantics/openAccessoai:recercat.cat:2445/2095522026-05-29T05:05:01Z |
| dc.title.none.fl_str_mv |
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy |
| title |
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy |
| spellingShingle |
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy Foerster, Michael Ones acústiques de superfície Microscòpia electrònica Fotoemissió Acoustic surface waves Electron microscopy Photoemission |
| title_short |
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy |
| title_full |
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy |
| title_fullStr |
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy |
| title_full_unstemmed |
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy |
| title_sort |
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy |
| dc.creator.none.fl_str_mv |
Foerster, Michael Statuto, Nahuel Casals Montserrat, Blai Hernández Mínguez, Alberto Finizio, Simone Mandziak, Ania Aballe, Lucía Hernández Ferràs, Joan Macià Bros, Ferran |
| author |
Foerster, Michael |
| author_facet |
Foerster, Michael Statuto, Nahuel Casals Montserrat, Blai Hernández Mínguez, Alberto Finizio, Simone Mandziak, Ania Aballe, Lucía Hernández Ferràs, Joan Macià Bros, Ferran |
| author_role |
author |
| author2 |
Statuto, Nahuel Casals Montserrat, Blai Hernández Mínguez, Alberto Finizio, Simone Mandziak, Ania Aballe, Lucía Hernández Ferràs, Joan Macià Bros, Ferran |
| author2_role |
author author author author author author author author |
| dc.subject.none.fl_str_mv |
Ones acústiques de superfície Microscòpia electrònica Fotoemissió Acoustic surface waves Electron microscopy Photoemission |
| topic |
Ones acústiques de superfície Microscòpia electrònica Fotoemissió Acoustic surface waves Electron microscopy Photoemission |
| description |
The quantification of surface acoustic waves (SAWs) in LiNbO3 piezoelectric crystals by stroboscopic X-ray photoemission electron microscopy (XPEEM), with a temporal smearing below 80 ps and a spatial resolution below 100 nm, is reported. The contrast mechanism is the varying piezoelectric surface potential associated with the SAW phase. Thus, kinetic energy spectra of photoemitted secondary electrons measure directly the SAW electrical amplitude and allow for the quantification of the associated strain. The stroboscopic imaging combined with a deliberate detuning allows resolving and quantifying the respective standing and propagating components of SAWs from a superposition of waves. Furthermore, standing-wave components can also be imaged by low-energy electron microscopy (LEEM). Our method opens the door to studies that quantitatively correlate SAWs excitation with a variety of sample electronic, magnetic and chemical properties. |
| publishDate |
2019 |
| dc.date.none.fl_str_mv |
2019 2024 2024 2024 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion |
| format |
article |
| status_str |
publishedVersion |
| dc.identifier.none.fl_str_mv |
https://hdl.handle.net/2445/209552 |
| url |
https://hdl.handle.net/2445/209552 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.relation.none.fl_str_mv |
Reproducció del document publicat a: https://doi.org/10.1107/S1600577518015370 Journal of Synchrotron Radiation, 2019, vol. 26, p. 184-193 https://doi.org/10.1107/S1600577518015370 |
| dc.rights.none.fl_str_mv |
(c) Foerster, Michael. et al., 2023 info:eu-repo/semantics/openAccess |
| rights_invalid_str_mv |
(c) Foerster, Michael. et al., 2023 |
| eu_rights_str_mv |
openAccess |
| dc.format.none.fl_str_mv |
10 p. application/pdf |
| dc.publisher.none.fl_str_mv |
Journal of Synchrotron Radiation |
| publisher.none.fl_str_mv |
Journal of Synchrotron Radiation |
| dc.source.none.fl_str_mv |
Articles publicats en revistes (Física Quàntica i Astrofísica) reponame:Recercat. Dipósit de la Recerca de Catalunya instname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya) |
| instname_str |
Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya) |
| reponame_str |
Recercat. Dipósit de la Recerca de Catalunya |
| collection |
Recercat. Dipósit de la Recerca de Catalunya |
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1869412953963364352 |
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15,81155 |