Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices
One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to danger...
| Autores: | , , , |
|---|---|
| Tipo de recurso: | capítulo de libro |
| Fecha de publicación: | 2011 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/45552 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/45552 |
| Access Level: | acceso abierto |
| Palabra clave: | 537.8 Analogue circuits Circuit reliability Resistors Transients Analog electronic devices Analog electronic systems reliability Energetic ions Load resistor Network loading Single-event transients Spatial missions Spurious transients Worst-case parameter Operational amplifiers SPICE Shape Transient analysis Transistors Voltage measurement Analog devices Bipolar technology Laser tests Single event transients System reliability Two-photon absorption Electrónica (Física) Óptica (Física) Circuitos integrados 2209.19 Óptica Física 2203.07 Circuitos Integrados |
| Sumario: | One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients. |
|---|