Characterization-Based Modeling of Retriggering and Afterpulsing for Passively Quenched CMOS SPADs

The current trend in the design of systems based on CMOS SPADs is to adopt smaller technological nodes, allowing the co-integration of additional electronics for the implementation of complex digital systems on chip. Due to their simplicity, a way to reduce the area occupied by the integrated electr...

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Detalhes bibliográficos
Autores: Moreno García, Manuel, Pancheri, Lucio, Perenzoni, Matteo, Río Fernández, Rocío del, Guerra Vinuesa, Oscar, Rodríguez Vázquez, Ángel Benito
Formato: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2019
País:España
Recursos:Universidad de Sevilla (US)
Repositorio:idUS. Depósito de Investigación de la Universidad de Sevilla
OAI Identifier:oai:idus.us.es:11441/90846
Acesso em linha:https://hdl.handle.net/11441/90846
https://doi.org/10.1109/JSEN.2019.2903937
Access Level:acceso abierto
Palavra-chave:CMOS
SPAD
Passive quenching
Afterpulsing
Retriggering
Modeling
Descrição
Resumo:The current trend in the design of systems based on CMOS SPADs is to adopt smaller technological nodes, allowing the co-integration of additional electronics for the implementation of complex digital systems on chip. Due to their simplicity, a way to reduce the area occupied by the integrated electronics is the use of passive quenching circuits (PQCs) instead of active (AQCs) or mixed (MQCs) ones. However, the recharge phase in PQCs is slower, so the device can be retriggered before this phase ends. This paper studies the phenomena of afterpulsing and retriggering, depending on the characteristics of the SPADs and the working conditions. In order to do that, a test chip containing SPADs of different size has been characterized in several operating environments. A mathematical model has been proposed for fitting afterpulsing phenomenon. It is shown that retriggering can be also described in terms of this model, suggesting that it is linked to carriers trapped in the shallow levels of the semiconductor and that should be taken into account when considering the total amount of afterpulsing events.