Supporting Information for Topochemical Synthesis and Electronic Structure of High-Crystallinity Infinite-Layer Nickelates on an Orthorhombic Substrate
Additional materials and methods, experimental details of the thin-film growth and reduction processes and characterization methods, and experimental and calculation data, including growth of precursor films; reduction processes; X-ray diffraction and atomic force microscopy; scanning transmission e...
| Autores: | , , , , , , , , , , , , , , , |
|---|---|
| Tipo de recurso: | conjunto de datos |
| Fecha de publicación: | 2025 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/397973 |
| Acceso en línea: | http://hdl.handle.net/10261/397973 |
| Access Level: | acceso abierto |
| Palabra clave: | Superconductivity remain elusive Provide new insights Perovskite precursor phase Nonlinear hall effect Doped phase Critical leap forward Orthorhombic substrate superconductivity Observe spectroscopic indications Superior crystallinity Reduced hybridization Ray scattering Questions regarding Quality thin Principles calculations Nd 5 Layer nickelates Intrinsic features Intricate questions Film nickelate Enhanced two Electronic structure Ni 3 |
| Sumario: | Additional materials and methods, experimental details of the thin-film growth and reduction processes and characterization methods, and experimental and calculation data, including growth of precursor films; reduction processes; X-ray diffraction and atomic force microscopy; scanning transmission electron microscopy; transport measurements; X-ray absorption spectroscopy and resonant inelastic X-ray scattering; density functional theory calculations; lattice parameters of infinite layer nickelate determined using STEM; visualization of oxygen atoms using annular bright field imaging; the strain distribution of infinite layer nickelate; XRD pattern of the reduction process using CaH2 and NaH; ABF-STEM image of the NdNiO3 film and the NdNiO2 film; the enlarged HADDF-STEM image and strain distribution of the interface region; magnetoresistance of representative samples; DFT calculated band structure; the experimental geometry of XAS and RIXS measurements; XRD data, fitting thickness, and resistivity of various NNO2 samples |
|---|