Characterizing and modeling backscattering in silicon microring resonators
We present an experimental technique to characterize back-scattering in silicon microring resonators, together with a simple analytical model that reproduces the experimental results. The model can extract all the key parameters of an add-drop-type resonator, which are the loss, both coupling coeffi...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2011 |
| País: | España |
| Institución: | Universitat Politècnica de València (UPV) |
| Repositorio: | RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia |
| Idioma: | inglés |
| OAI Identifier: | oai:riunet.upv.es:10251/30984 |
| Acceso en línea: | https://riunet.upv.es/handle/10251/30984 |
| Access Level: | acceso abierto |
| Palabra clave: | Analytical model Coupling coefficient Experimental techniques Key parameters Microring resonator Mathematical models Optical resonators Backscattering Silicon Article Chemistry Computer aided design Computer simulation Equipment Equipment design Light Optical instrumentation Radiation scattering Theoretical model Transducer Computer-Aided Design Equipment Failure Analysis Lenses Models, Theoretical Optical Devices Scattering, Radiation Transducers TEORIA DE LA SEÑAL Y COMUNICACIONES |
| Sumario: | We present an experimental technique to characterize back-scattering in silicon microring resonators, together with a simple analytical model that reproduces the experimental results. The model can extract all the key parameters of an add-drop-type resonator, which are the loss, both coupling coefficients and backscattering. We show that the backscattering effect strongly affects the resonance shape, and that consecutive resonances of the same ring can have very different backscattering parameters. © 2011 Optical Society of America. |
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