An analog cell to detect single event transients in voltage references
A reliable voltage reference is mandatory in mixed-signal systems. However, this family of components can undergo very long single event transients when operating in radiation environments such as space and nuclear facilities due to the impact of heavy ions. The purpose of the present paper is to de...
| Autores: | , , , |
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| Tipo de documento: | artigo |
| Data de publicação: | 2015 |
| País: | España |
| Recursos: | Universidad Complutense de Madrid (UCM) |
| Repositório: | Docta Complutense |
| Idioma: | inglês |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/33824 |
| Acesso em linha: | https://hdl.handle.net/20.500.14352/33824 |
| Access Level: | Acceso aberto |
| Palavra-chave: | 537.8 535 Voltage references Electrónica (Física) Optica (Química) |
| Resumo: | A reliable voltage reference is mandatory in mixed-signal systems. However, this family of components can undergo very long single event transients when operating in radiation environments such as space and nuclear facilities due to the impact of heavy ions. The purpose of the present paper is to demonstrate how a simple cell can be used to detect these transients. The cell was implemented with typical {COTS} components and its behavior was verified by {SPICE} simulations and in a laser facility. Different applications of the cell are explored as well. |
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