Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions
One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip-to-SIW transitions are de-embedded fro...
| Autores: | , , , |
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| Tipo de documento: | artigo |
| Data de publicação: | 2013 |
| País: | España |
| Recursos: | Universitat Politècnica de València (UPV) |
| Repositório: | RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia |
| Idioma: | inglês |
| OAI Identifier: | oai:riunet.upv.es:10251/54684 |
| Acesso em linha: | https://riunet.upv.es/handle/10251/54684 |
| Access Level: | Acceso aberto |
| Palavra-chave: | Substrate integrated waveguides (SIW) TEORIA DE LA SEÑAL Y COMUNICACIONES |
| Resumo: | One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip-to-SIW transitions are de-embedded from the measurements of the SIW structure by a thru-reflect-line calibration with an adequate and cheap SIW calibration kit. |
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