Ultrafast multi-photon excitation of ScVO4:Bi3+ for luminescence thermometry

We demonstrate a multi-photon excitation (MPE) scheme for luminescence thermometry using ScVO4:Bi3+. MPE is performed using a 37 fs Ti:sapphire laser pulse centered at 800 nm. Log-log plots of the phosphorescence intensity versus excitation power show that the 800 nm MPE of ScVO4:Bi3+ involves a 2-...

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Detalles Bibliográficos
Autores: Escofet Martín, David|||0000-0001-8943-6123, Ojo, Anthony, Peterson, Brian
Tipo de recurso: artículo
Fecha de publicación:2022
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/406795
Acceso en línea:https://hdl.handle.net/2117/406795
https://dx.doi.org/10.1364/OL.445763
Access Level:acceso abierto
Palabra clave:Microscopy
Thermography
Photonics
Luminescence
Microscòpia
Termografia
Fotònica
Luminescència
Àrees temàtiques de la UPC::Física::Física de l'estat sòlid::Luminiscència
Descripción
Sumario:We demonstrate a multi-photon excitation (MPE) scheme for luminescence thermometry using ScVO4:Bi3+. MPE is performed using a 37 fs Ti:sapphire laser pulse centered at 800 nm. Log-log plots of the phosphorescence intensity versus excitation power show that the 800 nm MPE of ScVO4:Bi3+ involves a 2- and 3-photon absorption process in comparison with a single-photon excitation (SPE) process at 266 and 400 nm. Spectroscopic investigation shows that with the 800 nm MPE and 266 nm SPE schemes, the emission spectra of ScVO4:Bi3+ are similarly characterized by emissions of the VO43- groups and Bi3+. MPE is advantageous to suppress fluorescence that interferes with the phosphorescence signal. We demonstrate this aspect for a ScVO4:Bi3+ coating applied on an alumina substrate. The luminescence lifetime is calibrated with temperature in the range of 294–334 K; the MPE scheme has an equally impressive temperature sensitivity (3.4–1.7%/K) and precision (0.2–0.7 K) compared with the SPE schemes. The MPE scheme can be applied to a variety of phosphors and is valuable for precise temperature measurements, even in applications where isolating interfering background emissions is challenging.