Metal island film-based structures for sensing using spectrophotometry and ellipsometry

Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a...

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Detalhes bibliográficos
Autores: Janicki, V., Sancho i Parramon, Jordi, Bosch i Puig, Salvador, Zorc, H., Belarre, F. J., Arbiol i Cobos, Jordi
Tipo de documento: artigo
Estado:Versión aceptada para publicación
Data de publicação:2014
País:España
Recursos:Universidad de Barcelona
Repositório:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/98783
Acesso em linha:https://hdl.handle.net/2445/98783
Access Level:Acceso aberto
Palavra-chave:Ressonància de plasmons superficials
Pel·lícules metàl·liques
El·lipsometria
Surface plasmon resonance
Metallic films
Ellipsometry
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spelling Metal island film-based structures for sensing using spectrophotometry and ellipsometryJanicki, V.Sancho i Parramon, JordiBosch i Puig, SalvadorZorc, H.Belarre, F. J.Arbiol i Cobos, JordiRessonància de plasmons superficialsPel·lícules metàl·liquesEl·lipsometriaSurface plasmon resonanceMetallic filmsEllipsometryMetal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.Springer Verlag2014info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersionapplication/pdfhttps://hdl.handle.net/2445/98783Articles publicats en revistes (Física Aplicada)reponame:Dipòsit Digital de la UBinstname:Universidad de BarcelonaInglésVersió postprint del document publicat a: http://dx.doi.org/10.1007/s00339-013-8056-xApplied Physics A-Materials Science & Processing, 2014, vol. 115, num. 2, p. 481-486http://dx.doi.org/10.1007/s00339-013-8056-x(c) Springer Verlag, 2014info:eu-repo/semantics/openAccessoai:diposit.ub.edu:2445/987832026-05-27T06:46:51Z
dc.title.none.fl_str_mv Metal island film-based structures for sensing using spectrophotometry and ellipsometry
title Metal island film-based structures for sensing using spectrophotometry and ellipsometry
spellingShingle Metal island film-based structures for sensing using spectrophotometry and ellipsometry
Janicki, V.
Ressonància de plasmons superficials
Pel·lícules metàl·liques
El·lipsometria
Surface plasmon resonance
Metallic films
Ellipsometry
title_short Metal island film-based structures for sensing using spectrophotometry and ellipsometry
title_full Metal island film-based structures for sensing using spectrophotometry and ellipsometry
title_fullStr Metal island film-based structures for sensing using spectrophotometry and ellipsometry
title_full_unstemmed Metal island film-based structures for sensing using spectrophotometry and ellipsometry
title_sort Metal island film-based structures for sensing using spectrophotometry and ellipsometry
dc.creator.none.fl_str_mv Janicki, V.
Sancho i Parramon, Jordi
Bosch i Puig, Salvador
Zorc, H.
Belarre, F. J.
Arbiol i Cobos, Jordi
author Janicki, V.
author_facet Janicki, V.
Sancho i Parramon, Jordi
Bosch i Puig, Salvador
Zorc, H.
Belarre, F. J.
Arbiol i Cobos, Jordi
author_role author
author2 Sancho i Parramon, Jordi
Bosch i Puig, Salvador
Zorc, H.
Belarre, F. J.
Arbiol i Cobos, Jordi
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Ressonància de plasmons superficials
Pel·lícules metàl·liques
El·lipsometria
Surface plasmon resonance
Metallic films
Ellipsometry
topic Ressonància de plasmons superficials
Pel·lícules metàl·liques
El·lipsometria
Surface plasmon resonance
Metallic films
Ellipsometry
description Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.
publishDate 2014
dc.date.none.fl_str_mv 2014
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/98783
url https://hdl.handle.net/2445/98783
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Versió postprint del document publicat a: http://dx.doi.org/10.1007/s00339-013-8056-x
Applied Physics A-Materials Science & Processing, 2014, vol. 115, num. 2, p. 481-486
http://dx.doi.org/10.1007/s00339-013-8056-x
dc.rights.none.fl_str_mv (c) Springer Verlag, 2014
info:eu-repo/semantics/openAccess
rights_invalid_str_mv (c) Springer Verlag, 2014
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Springer Verlag
publisher.none.fl_str_mv Springer Verlag
dc.source.none.fl_str_mv Articles publicats en revistes (Física Aplicada)
reponame:Dipòsit Digital de la UB
instname:Universidad de Barcelona
instname_str Universidad de Barcelona
reponame_str Dipòsit Digital de la UB
collection Dipòsit Digital de la UB
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,301603

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