Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors

Electrolyte-gated organic transistors (EGOTs) leveraging organic semiconductors' electronic and ionic transport characteristics are the key enablers for many biosensing and bioelectronic applications that can selectively sense, record, and monitor different biological and biochemical processes...

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Authors: Tanwar, Shubham, Millan Solsona, Ruben, Ruiz Molina, Sara, Mas Torrent, Marta, Kyndiah, Adrica, Gomila, Gabriel
Format: article
Status:Published version
Publication Date:2024
Country:España
Institution:Consejo Superior de Investigaciones Científicas (CSIC)
Repository:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/364987
Online Access:http://hdl.handle.net/10261/364987
https://api.elsevier.com/content/abstract/scopus_id/85197648015
Access Level:Open access
Keyword:Automation
Electrolyte-gated organic transistors
Nanoscale
Operando scanning dielectric microscopy
Transistor degradation
id ES_783efca2b7947df1f48a807e90cf5a74
oai_identifier_str oai:digital.csic.es:10261/364987
network_acronym_str ES
network_name_str España
repository_id_str
dc.title.none.fl_str_mv Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors
title Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors
spellingShingle Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors
Tanwar, Shubham
Automation
Electrolyte-gated organic transistors
Nanoscale
Operando scanning dielectric microscopy
Transistor degradation
title_short Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors
title_full Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors
title_fullStr Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors
title_full_unstemmed Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors
title_sort Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic Transistors
dc.creator.none.fl_str_mv Tanwar, Shubham
Millan Solsona, Ruben
Ruiz Molina, Sara
Mas Torrent, Marta
Kyndiah, Adrica
Gomila, Gabriel
author Tanwar, Shubham
author_facet Tanwar, Shubham
Millan Solsona, Ruben
Ruiz Molina, Sara
Mas Torrent, Marta
Kyndiah, Adrica
Gomila, Gabriel
author_role author
author2 Millan Solsona, Ruben
Ruiz Molina, Sara
Mas Torrent, Marta
Kyndiah, Adrica
Gomila, Gabriel
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv European Commission
Ministerio de Ciencia, Innovación y Universidades (España)
Ministerio de Ciencia e Innovación (España)
Agencia Estatal de Investigación (España)
ICREA Acadèmia
Generalitat de Catalunya
Tanwar, Shubham [0000-0002-9418-2532]
Kyndiah, Adrica [0000-0002-4668-6330]
Gomila, Gabriel [0000-0002-1949-1757]
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Automation
Electrolyte-gated organic transistors
Nanoscale
Operando scanning dielectric microscopy
Transistor degradation
topic Automation
Electrolyte-gated organic transistors
Nanoscale
Operando scanning dielectric microscopy
Transistor degradation
description Electrolyte-gated organic transistors (EGOTs) leveraging organic semiconductors' electronic and ionic transport characteristics are the key enablers for many biosensing and bioelectronic applications that can selectively sense, record, and monitor different biological and biochemical processes at the nanoscale and translate them into macroscopic electrical signals. Understanding such transduction mechanisms requires multiscale characterization tools to comprehensively probe local electrical properties and link them with device behavior across various bias points. Here, an automated scanning dielectric microscopy toolbox is demonstrated that performs operando in-liquid scanning dielectric microscopy measurements on functional EGOTs and carries out extensive data analysis to unravel the evolution of local electrical properties in minute detail. This paper emphasizes critical experimental considerations permitting standardized, accurate, and reproducible data acquisition. The developed approach is validated with EGOTs based on blends of organic small molecule semiconductor and insulating polymer that work as accumulation-mode field-effect transistors. Furthermore, the degradation of local electrical characteristics at high gate voltages is probed, which is apparently driven by the destruction of local crystalline order due to undesirable electrochemical swelling of the organic semiconducting material near the source electrode edge. The developed approach paves the way for systematic probing of EGOT-based technologies for targeted optimization and fundamental understanding.
publishDate 2024
dc.date.none.fl_str_mv 2024
2024
2024
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Publisher's version
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/364987
https://api.elsevier.com/content/abstract/scopus_id/85197648015
url http://hdl.handle.net/10261/364987
https://api.elsevier.com/content/abstract/scopus_id/85197648015
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv #PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
813863
101046719
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-142297NB-I00
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-141393OB-I00
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-110210GB-I00
info:eu-repo/grantAgreement/AEI/Plan Estatal de investigación Científica y Técnica y de Innovación 2017-2020/CEX2019-000917-S
Advanced Electronic Materials
http://doi.org/10.1002/aelm.202400222
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Wiley-VCH
publisher.none.fl_str_mv Wiley-VCH
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869411194786283520
spelling Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte-Gated Organic TransistorsTanwar, ShubhamMillan Solsona, RubenRuiz Molina, SaraMas Torrent, MartaKyndiah, AdricaGomila, GabrielAutomationElectrolyte-gated organic transistorsNanoscaleOperando scanning dielectric microscopyTransistor degradationElectrolyte-gated organic transistors (EGOTs) leveraging organic semiconductors' electronic and ionic transport characteristics are the key enablers for many biosensing and bioelectronic applications that can selectively sense, record, and monitor different biological and biochemical processes at the nanoscale and translate them into macroscopic electrical signals. Understanding such transduction mechanisms requires multiscale characterization tools to comprehensively probe local electrical properties and link them with device behavior across various bias points. Here, an automated scanning dielectric microscopy toolbox is demonstrated that performs operando in-liquid scanning dielectric microscopy measurements on functional EGOTs and carries out extensive data analysis to unravel the evolution of local electrical properties in minute detail. This paper emphasizes critical experimental considerations permitting standardized, accurate, and reproducible data acquisition. The developed approach is validated with EGOTs based on blends of organic small molecule semiconductor and insulating polymer that work as accumulation-mode field-effect transistors. Furthermore, the degradation of local electrical characteristics at high gate voltages is probed, which is apparently driven by the destruction of local crystalline order due to undesirable electrochemical swelling of the organic semiconducting material near the source electrode edge. The developed approach paves the way for systematic probing of EGOT-based technologies for targeted optimization and fundamental understanding.This work received funding from the European Union's Horizon 2020 research and innovation program under the Marie Skłodowska-Curie grant agreement No 813863 (BORGES), the EIC Pathfinder PRINGLE project (grant agreement No 101046719), from the Spanish Ministerio de Economıa, Industria y Competitividad, and EU FEDER, through grant no. PID2019-110210GB-I00 (BIGDATASPM), from the Ministerio de Ciencia e Innovacion through grant no. PID2022-142297NB-I00 (BIOMEDSPM40), from the Generalitat de Catalunya through CERCA, and from the ICREA foundation (ICREA Academia award to G.G.). S.T. acknowledges the support from Joerg Barner (JPK) regarding automating the AFM operations. S.R.-M. and M.M.-T. acknowledge MCIN/AEI/10.13039/501100011033/ERDF,UE with project SENSATION PID2022-141393OB-I00, the “Severo Ochoa” Programme for Centers of Excellence in R&D (FUNFUTURECEX2019-000917-S) and Generalitat de Catalunya (2021-SGR-00443).With funding from the Spanish government through the ‘Severo Ochoa Centre of Excellence’ accreditation (CEX2019-000917-S).Peer reviewedWiley-VCHEuropean CommissionMinisterio de Ciencia, Innovación y Universidades (España)Ministerio de Ciencia e Innovación (España)Agencia Estatal de Investigación (España)ICREA AcadèmiaGeneralitat de CatalunyaTanwar, Shubham [0000-0002-9418-2532]Kyndiah, Adrica [0000-0002-4668-6330]Gomila, Gabriel [0000-0002-1949-1757]Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202420242024info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Publisher's versioninfo:eu-repo/semantics/publishedVersionhttp://hdl.handle.net/10261/364987https://api.elsevier.com/content/abstract/scopus_id/85197648015reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglés#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#813863101046719info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-142297NB-I00info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-141393OB-I00info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-110210GB-I00info:eu-repo/grantAgreement/AEI/Plan Estatal de investigación Científica y Técnica y de Innovación 2017-2020/CEX2019-000917-SAdvanced Electronic Materialshttp://doi.org/10.1002/aelm.202400222Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/3649872026-05-22T06:33:51Z
score 15,811543

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