Numerical optimization of hybrid dielectric/HTS resonators for surface impedance evaluation of HTS films

This work describes an alternative to the traditional dielectric resonator topology used for measuring surface impedance in High Temperature Superconducting (HTS) films. A gap is introduced above the dielectric so that only the lower film is in direct contact with it. This arrangement has been used...

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Detalles Bibliográficos
Autores: Collado Gómez, Juan Carlos|||0000-0002-8869-2739, Gonzalo Riera, David, Rozan, Edouard, O'Callaghan Castellà, Juan Manuel|||0000-0002-2740-0202
Tipo de recurso: artículo
Fecha de publicación:1999
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/998
Acceso en línea:https://hdl.handle.net/2117/998
Access Level:acceso abierto
Palabra clave:Dielectric resonators
Impedance (Electricity) Measurement.
Resonators
Superconducting films
Electric impedance measurement
High temperature superconductors
Algorithms
Dielectric losses
Surface measurement
Numerical analysis
Optimization
Dielectric resonator topology
Resonator losses
Numerically efficient mode matching algorithms
Resonadors dielèctrics
Impedància (Electricitat)
Àrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics
Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
Descripción
Sumario:This work describes an alternative to the traditional dielectric resonator topology used for measuring surface impedance in High Temperature Superconducting (HTS) films. A gap is introduced above the dielectric so that only the lower film is in direct contact with it. This arrangement has been used extensively for mechanical tuning of dielectric resonators and, when used for surface impedance measurement, it can be designed to make the losses in the upper film small relative to the overall resonator losses. Then, measured results are mostly due to one of the films and not the average of two. The specifics of a resonator design for measuring 2-inch wafers are presented. An analysis and optimization of the resonator is done using a numerically efficient mode-matching algorithm.