Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process
The optical, mechanical, and microstructural properties of MgF2 single layers grown by ion beam sputtering have been investigated by spectrophotometric measurements, film stress characterization, x-ray photoelectron spectroscopy (XPS), x-ray diffraction, and transmission electron microscopy. The dep...
| Autores: | , , , |
|---|---|
| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2000 |
| País: | España |
| Institución: | Universidad de Barcelona |
| Repositorio: | Dipòsit Digital de la UB |
| OAI Identifier: | oai:diposit.ub.edu:2445/25050 |
| Acceso en línea: | https://hdl.handle.net/2445/25050 |
| Access Level: | acceso abierto |
| Palabra clave: | Propietats òptiques Revestiments Microscòpia electrònica Fluorurs Pel·lícules fines Làsers Optical properties Coatings Electron microscopy Fluorides Thin films Lasers |
| id |
ES_70ea6de5eb2abd6bc540be4db8b798fb |
|---|---|
| oai_identifier_str |
oai:diposit.ub.edu:2445/25050 |
| network_acronym_str |
ES |
| network_name_str |
España |
| repository_id_str |
|
| spelling |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering processQuesnel, EtienneDumas, L.Jacob, D.Peiró Martínez, FranciscaPropietats òptiquesRevestimentsMicroscòpia electrònicaFluorursPel·lícules finesLàsersOptical propertiesCoatingsElectron microscopyFluoridesThin filmsLasersThe optical, mechanical, and microstructural properties of MgF2 single layers grown by ion beam sputtering have been investigated by spectrophotometric measurements, film stress characterization, x-ray photoelectron spectroscopy (XPS), x-ray diffraction, and transmission electron microscopy. The deposition conditions, using fluorine reactive gas or not, have been found to greatly influence the optical absorption and the stress of the films as well as their microstructure. The layers grown with fluorine compensation exhibit a regular columnar microstructure and an UV-optical absorption which can be very low, either as deposited or after thermal annealings at very low temperatures. On the contrary, layers grown without fluorine compensation exhibit a less regular microstructure and a high ultraviolet absorption which is particularly hard to cure. On the basis of calculations, it is shown that F centers are responsible for this absorption, whereas all the films were found to be stoichiometric, in the limit of the XPS sensitivity. On the basis of external data taken from literature, our experimental curves are analyzed, so we propose possible diffusion mechanisms which could explain the behaviors of the coatings.American Institute of Physics2000info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfhttps://hdl.handle.net/2445/25050Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)reponame:Dipòsit Digital de la UBinstname:Universidad de BarcelonaInglésReproducció del document publicat a: http://dx.doi.org/10.1116/1.1290374Journal of Vacuum Science Technology A-Vacuum Surfaces and Films, 2000, vol. 18, p. 2869-2876http://dx.doi.org/10.1116/1.1290374(c) American Institute of Physics, 2000info:eu-repo/semantics/openAccessoai:diposit.ub.edu:2445/250502026-05-27T06:46:51Z |
| dc.title.none.fl_str_mv |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process |
| title |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process |
| spellingShingle |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process Quesnel, Etienne Propietats òptiques Revestiments Microscòpia electrònica Fluorurs Pel·lícules fines Làsers Optical properties Coatings Electron microscopy Fluorides Thin films Lasers |
| title_short |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process |
| title_full |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process |
| title_fullStr |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process |
| title_full_unstemmed |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process |
| title_sort |
Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process |
| dc.creator.none.fl_str_mv |
Quesnel, Etienne Dumas, L. Jacob, D. Peiró Martínez, Francisca |
| author |
Quesnel, Etienne |
| author_facet |
Quesnel, Etienne Dumas, L. Jacob, D. Peiró Martínez, Francisca |
| author_role |
author |
| author2 |
Dumas, L. Jacob, D. Peiró Martínez, Francisca |
| author2_role |
author author author |
| dc.subject.none.fl_str_mv |
Propietats òptiques Revestiments Microscòpia electrònica Fluorurs Pel·lícules fines Làsers Optical properties Coatings Electron microscopy Fluorides Thin films Lasers |
| topic |
Propietats òptiques Revestiments Microscòpia electrònica Fluorurs Pel·lícules fines Làsers Optical properties Coatings Electron microscopy Fluorides Thin films Lasers |
| description |
The optical, mechanical, and microstructural properties of MgF2 single layers grown by ion beam sputtering have been investigated by spectrophotometric measurements, film stress characterization, x-ray photoelectron spectroscopy (XPS), x-ray diffraction, and transmission electron microscopy. The deposition conditions, using fluorine reactive gas or not, have been found to greatly influence the optical absorption and the stress of the films as well as their microstructure. The layers grown with fluorine compensation exhibit a regular columnar microstructure and an UV-optical absorption which can be very low, either as deposited or after thermal annealings at very low temperatures. On the contrary, layers grown without fluorine compensation exhibit a less regular microstructure and a high ultraviolet absorption which is particularly hard to cure. On the basis of calculations, it is shown that F centers are responsible for this absorption, whereas all the films were found to be stoichiometric, in the limit of the XPS sensitivity. On the basis of external data taken from literature, our experimental curves are analyzed, so we propose possible diffusion mechanisms which could explain the behaviors of the coatings. |
| publishDate |
2000 |
| dc.date.none.fl_str_mv |
2000 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion |
| format |
article |
| status_str |
publishedVersion |
| dc.identifier.none.fl_str_mv |
https://hdl.handle.net/2445/25050 |
| url |
https://hdl.handle.net/2445/25050 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.relation.none.fl_str_mv |
Reproducció del document publicat a: http://dx.doi.org/10.1116/1.1290374 Journal of Vacuum Science Technology A-Vacuum Surfaces and Films, 2000, vol. 18, p. 2869-2876 http://dx.doi.org/10.1116/1.1290374 |
| dc.rights.none.fl_str_mv |
(c) American Institute of Physics, 2000 info:eu-repo/semantics/openAccess |
| rights_invalid_str_mv |
(c) American Institute of Physics, 2000 |
| eu_rights_str_mv |
openAccess |
| dc.format.none.fl_str_mv |
application/pdf |
| dc.publisher.none.fl_str_mv |
American Institute of Physics |
| publisher.none.fl_str_mv |
American Institute of Physics |
| dc.source.none.fl_str_mv |
Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) reponame:Dipòsit Digital de la UB instname:Universidad de Barcelona |
| instname_str |
Universidad de Barcelona |
| reponame_str |
Dipòsit Digital de la UB |
| collection |
Dipòsit Digital de la UB |
| repository.name.fl_str_mv |
|
| repository.mail.fl_str_mv |
|
| _version_ |
1869410614945775616 |
| score |
15.301603 |