Depth mapping of metallic nanowire polymer nanocomposites by scanning dielectric microscopy

Polymer nanocomposite materials based on metallic nanowires are widely investigated as transparent and flexible electrodes or as stretchable conductors and dielectrics for biosensing. Here we show that Scanning Dielectric Microscopy (SDM) can map the depth distribution of metallic nanowires within t...

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Detalles Bibliográficos
Autores: Balakrishnan, Harishankar, Millán Solsona, Rubén, Castaño Linares, Óscar, Fabregas, Rene, Fumagalli, Laura, 1959-, Gomila Lluch, Gabriel
Tipo de recurso: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2021
País:España
Institución:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
Repositorio:Recercat. Dipósit de la Recerca de Catalunya
OAI Identifier:oai:recercat.cat:2445/202180
Acceso en línea:https://hdl.handle.net/2445/202180
Access Level:acceso abierto
Palabra clave:Materials nanoestructurats
Microscòpia electrònica d'escombratge
Nanostructured materials
Scanning electron microscopy
Descripción
Sumario:Polymer nanocomposite materials based on metallic nanowires are widely investigated as transparent and flexible electrodes or as stretchable conductors and dielectrics for biosensing. Here we show that Scanning Dielectric Microscopy (SDM) can map the depth distribution of metallic nanowires within the nanocomposites in a non-destructive way. This is achieved by a quantitative analysis of sub-surface electrostatic force microscopy measurements with finite-element numerical calculations. As an application, we determined the three-dimensional spatial distribution of ∼∼∼∼ 50 nm diameter silver nanowires in ∼∼∼∼ 100−250 nm thick gelatin films. The characterization is done both under dry ambient conditions, where gelatin shows a relatively low dielectric constant, r ∼∼∼∼ 5, and under humid ambient conditions, where its dielectric constant increases up to r ∼∼∼∼ 14. The present results show that SDM can be a valuable non-destructive subsurface characterization technique for nanowire-based nanocomposite materials, which can contribute to the optimization of these materials for applications in fields such as wearable electronics, solar cell technologies or printable electronics.