Insights on the thermal stability of the Sb2Se3 quasi-1D photovoltaic technology
This work explores the thermal stability of antimony-based photovoltaic (PV) technologies investigating the effect of low-temperature (50—350¿°C) postdeposition annealings (PDAs) on bare Sb2Se3 absorbers and complete SLG/Mo/Sb2Se3/CdS/i-ZnO/ITO devices (5.7% power conversion efficiency with no anti-...
| Autores: | , , , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2021 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/361241 |
| Acceso en línea: | https://hdl.handle.net/2117/361241 https://dx.doi.org/10.1002/solr.202100517 |
| Access Level: | acceso abierto |
| Palabra clave: | Photovoltaic power generation Energia solar fotovoltaica Àrees temàtiques de la UPC::Energies::Energia solar fotovoltaica |
| Sumario: | This work explores the thermal stability of antimony-based photovoltaic (PV) technologies investigating the effect of low-temperature (50—350¿°C) postdeposition annealings (PDAs) on bare Sb2Se3 absorbers and complete SLG/Mo/Sb2Se3/CdS/i-ZnO/ITO devices (5.7% power conversion efficiency with no anti-reflecting coating or metallic grid). A comprehensive structural analysis by means of X-ray diffraction and Raman spectroscopy, coupled with optoelectronic characterization, reveals clear evidences of a degradation process dominated by selenium diffusion. The degradation process is observed to start at low PDA temperatures as a shrinkage of the Sb2Se3 unit cell. Further increasing the PDA temperature above 200¿°C leads to the formation of Sb oxides and Se secondary phases in bare absorbers, and of CdS1—x Se x in complete devices at the Sb2Se3 front interface which completely degrade the heterojunction and kill device performance. Furthermore, a clear correlation is found between PV performance decrease and Sb2Se3 layer lattice shrinkage with the increasing PDA temperature (T¿>¿50¿°C). This is the first time that thermal instability is reported for the Sb2Se3 compound at temperatures commonly used during PV module fabrication processes such as emitter/transparent conducting oxide deposition or encapsulation. |
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