Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm u...

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Detalles Bibliográficos
Autores: Ghosh, S., Haefner, J., Martín-Albo, J., Guenette, R., Li, X., Loya Villalpando, A.A., Burch, C., Adams, C., Álvarez, V., Arazi, L., Arnquist, I.J., Azevedo, C.D.R., Bailey, K., Ballester, F., Benlloch-Rodríguez, J.M., Borges, F.I.G.M., Byrnes, N., Cárcel, S., Carrión, J.V., Cebrián, S., Church, E., Conde, C.A.N., Contreras, T., Díaz, G., Díaz, J., Diesburg, M., Escada, J., Esteve, R., Felkai, R., Fernandes, A.F.M., Fernandes, L.M.P., Ferrario, P., Ferreira, A.L., Freitas, E.D.C., Goldschmidt, A., Gómez-Cadenas, J.J., González-Díaz, D., Gutiérrez, R.M., Hafidi, K., Hauptman, J., Henriques, C.A.O., Hernando Morata, J.A., Herrero, P., Herrero, V., Ifergan, Y., Jones, B.J.P., Kekic, M., Labarga, L., Laing, A., Lebrun, P., López-March, N., Losada, M., Mano, R.D.P., Martínez, A., Martínez-Vara, M., Martínez-Lema, G., McDonald, A.D., Monrabal, F., Monteiro, C.M.B., Mora, F.J., Muñoz Vidal, J., Novella, P., Nygren, D.R., Palmeiro, B., Para, A., Pérez, J., Querol, M., Redwine, A., Renner, J., Repond, J., Riordan, S., Ripoll, L., Rodríguez García, Y., Rodríguez, J., Rogers, L., Romeo, B., Romo-Luque, C., Santos, F.P., dos Santos, J.M.F., Simón, A., Sorel, M., Stiegler, T., Toledo, J.F., Torrent, J., Usón, A., Veloso, J.F.C.A., Webb, R., Weiss-Babai, R., White, J.T., Woodruff, K., Yahlali, N., The, NEXT, collaboration
Tipo de recurso: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2020
País:España
Institución:Universidad de Zaragoza
Repositorio:Zaguán. Repositorio Digital de la Universidad de Zaragoza
OAI Identifier:oai:zaguan.unizar.es:97404
Acceso en línea:http://zaguan.unizar.es/record/97404
Access Level:acceso abierto
Descripción
Sumario:Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm. We also see that the reflectance of PTFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.

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