Cita APA

Viqueira Rodríguez, M., Borghello, G., & López Vallejo, M. (2026). Ionization radiation damage of 65 nm nMOS technologies under different bulk voltages and temperatures.

Citación estilo Chicago

Viqueira Rodríguez, Manuel|||0009-0003-8557-9743, Giulio|||0000-0003-4771-7482 Borghello, y Marisa|||0000-0002-3833-524X López Vallejo. Ionization Radiation Damage of 65 Nm NMOS Technologies Under Different Bulk Voltages and Temperatures. 2026.

Cita MLA

Viqueira Rodríguez, Manuel|||0009-0003-8557-9743, Giulio|||0000-0003-4771-7482 Borghello, y Marisa|||0000-0002-3833-524X López Vallejo. Ionization Radiation Damage of 65 Nm NMOS Technologies Under Different Bulk Voltages and Temperatures. 2026.