Cita APA

Juarez-Perez, E. J., & Qi, Y. (2019). Determination of Carrier Diffusion Length Using Transient Electron Photoemission Microscopy in the GaAs/InSe Heterojunction.

Citación estilo Chicago

Juarez-Perez, Emilio J., y Yabing Qi. Determination of Carrier Diffusion Length Using Transient Electron Photoemission Microscopy in the GaAs/InSe Heterojunction. 2019.

Cita MLA

Juarez-Perez, Emilio J., y Yabing Qi. Determination of Carrier Diffusion Length Using Transient Electron Photoemission Microscopy in the GaAs/InSe Heterojunction. 2019.