Esquivias, I., Weisser, S., Romero, B., & Ralston, J. (1996). Carrier capture and escape times in In0.35Ga0.65As-GaAs multiquantum-well lasers determined from high-frequency electrical impedance measurements.
Citación estilo ChicagoEsquivias, Ignacio, Stephan Weisser, Beatriz Romero, y John Ralston. Carrier Capture and Escape Times in In0.35Ga0.65As-GaAs Multiquantum-well Lasers Determined From High-frequency Electrical Impedance Measurements. 1996.
Cita MLAEsquivias, Ignacio, Stephan Weisser, Beatriz Romero, y John Ralston. Carrier Capture and Escape Times in In0.35Ga0.65As-GaAs Multiquantum-well Lasers Determined From High-frequency Electrical Impedance Measurements. 1996.
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