Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy

We explore the possibility to perform an in-situ transmission electron microscopy (TEM) thermoelectric characterization of materials. A differential heating element on a custom in-situ TEM microchip allows to generate a temperature gradient across the studied materials, which are simultaneously meas...

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Autores: Hettler, Simon, Furqan, Mohammad, Sotelo, Andres, Arenal, Raúl
Formato: artículo
Estado:Versión publicada
Fecha de publicación:2025
País:España
Recursos:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/390263
Acesso em linha:http://hdl.handle.net/10261/390263
Access Level:acceso abierto
Palavra-chave:In-situ transmission electron microscopy
Seebeck coefficient
Thermoelectricity
Nanomaterial
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dc.title.none.fl_str_mv Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
title Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
spellingShingle Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
Hettler, Simon
In-situ transmission electron microscopy
Seebeck coefficient
Thermoelectricity
Nanomaterial
title_short Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
title_full Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
title_fullStr Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
title_full_unstemmed Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
title_sort Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
dc.creator.none.fl_str_mv Hettler, Simon
Furqan, Mohammad
Sotelo, Andres
Arenal, Raúl
author Hettler, Simon
author_facet Hettler, Simon
Furqan, Mohammad
Sotelo, Andres
Arenal, Raúl
author_role author
author2 Furqan, Mohammad
Sotelo, Andres
Arenal, Raúl
author2_role author
author
author
dc.contributor.none.fl_str_mv European Commission
Gobierno de Aragón
Agencia Estatal de Investigación (España)
Ministerio de Ciencia, Innovación y Universidades (España)
Universidad de Zaragoza
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv In-situ transmission electron microscopy
Seebeck coefficient
Thermoelectricity
Nanomaterial
topic In-situ transmission electron microscopy
Seebeck coefficient
Thermoelectricity
Nanomaterial
description We explore the possibility to perform an in-situ transmission electron microscopy (TEM) thermoelectric characterization of materials. A differential heating element on a custom in-situ TEM microchip allows to generate a temperature gradient across the studied materials, which are simultaneously measured electrically. A thermovoltage was induced in all studied devices, whose sign corresponds to the sign of the Seebeck coefficient of the tested materials. The results indicate that in-situ thermoelectric TEM studies can help to profoundly understand fundamental aspects of thermoelectricity, which is exemplary demonstrated by tracking the thermovoltage during in-situ crystallization of an amorphous Ge thin film. We propose an improved in-situ TEM microchip design, which should facilitate a full quantitative measurement of the induced temperature gradient, the electrical and thermal conductivities, as well as the Seebeck coefficient. The benefit of the in-situ approach is the possibility to directly correlate the thermoelectric properties with the structure and chemical composition of the entire studied device down to the atomic level, including grain boundaries, dopants or crystal defects, and to trace its dynamic evolution upon heating or during the application of electrical currents.
publishDate 2025
dc.date.none.fl_str_mv 2025
2025
2025
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Publisher's version
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dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/390263
url http://hdl.handle.net/10261/390263
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
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info:eu-repo/grantAgreement/EC/H2020/889546
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-104739GB-I00
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2023-151080NB-I00
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/CEX2023-001286-S
Hettler, Simon; Furqan, Mohammad; Sotelo, Andres; Arenal, Raúl; 2025; Appendix A. Supplementary data: Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy [Dataset]; Elsevier; https://doi.org/10.1016/j.ultramic.2024.114071
https://doi.org/10.1016/j.ultramic.2024.114071
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dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
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spelling Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopyHettler, SimonFurqan, MohammadSotelo, AndresArenal, RaúlIn-situ transmission electron microscopySeebeck coefficientThermoelectricityNanomaterialWe explore the possibility to perform an in-situ transmission electron microscopy (TEM) thermoelectric characterization of materials. A differential heating element on a custom in-situ TEM microchip allows to generate a temperature gradient across the studied materials, which are simultaneously measured electrically. A thermovoltage was induced in all studied devices, whose sign corresponds to the sign of the Seebeck coefficient of the tested materials. The results indicate that in-situ thermoelectric TEM studies can help to profoundly understand fundamental aspects of thermoelectricity, which is exemplary demonstrated by tracking the thermovoltage during in-situ crystallization of an amorphous Ge thin film. We propose an improved in-situ TEM microchip design, which should facilitate a full quantitative measurement of the induced temperature gradient, the electrical and thermal conductivities, as well as the Seebeck coefficient. The benefit of the in-situ approach is the possibility to directly correlate the thermoelectric properties with the structure and chemical composition of the entire studied device down to the atomic level, including grain boundaries, dopants or crystal defects, and to trace its dynamic evolution upon heating or during the application of electrical currents.The authors acknowledge funding from the European Union’s Horizon 2020 research and innovation programme under the Marie Sklodowska-Curie grant agreement No 889546, the Government of Aragon (DGA) through the project E13_23R, the Spanish MICIU with funding from European Union Next Generation EU (PRTR-C17.I1) promoted by the Government of Aragon and by the Spanish MICIU (PID2019-104739GB-100/AEI/10.13039/501100011033, PID2023-151080NB-I00/AEI/10.13039/501100011033 and CEX2023-001286-S MICIU/AEI 10.13039/501100011033). The microscopy works have been conducted in the Laboratorio de Microscopias Avanzadas (LMA) at Universidad de Zaragoza. Sample courtesy (MLC NT) from MB Sreedhara and R. Tenne (MLC NT, Weizmann Institute of Science, Israel) is acknowledged. The authors thank M. Rengifo (INMA, CSIC-Universidad de Zaragoza) for discussions about electrical characterizations, P. Strichovanek (INMA, CSIC-Universidad de Zaragoza) for Ti-Pt sputter deposition, R. Valero (LMA, Universidad de Zaragoza) for support with MEMS and Ge thin-film fabrication and N. Navascues (INMA, CSIC-Universidad de Zaragoza) for support with Raman acquisition.With funding from the Spanish government through the "Severo Ochoa Centre of Excellence" accreditation (CEX2023-001286-S).Peer reviewedElsevierEuropean CommissionGobierno de AragónAgencia Estatal de Investigación (España)Ministerio de Ciencia, Innovación y Universidades (España)Universidad de ZaragozaConsejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202520252025info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Publisher's versioninfo:eu-repo/semantics/publishedVersionapplication/pdfhttp://hdl.handle.net/10261/390263reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglés#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#info:eu-repo/grantAgreement/EC/H2020/889546info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-104739GB-I00info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2023-151080NB-I00info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/CEX2023-001286-SHettler, Simon; Furqan, Mohammad; Sotelo, Andres; Arenal, Raúl; 2025; Appendix A. Supplementary data: Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy [Dataset]; Elsevier; https://doi.org/10.1016/j.ultramic.2024.114071https://doi.org/10.1016/j.ultramic.2024.114071Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/3902632026-05-22T06:33:51Z
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