Intensity-based axial localization at the quantum limit
We derive fundamental precision bounds for single-point axial localization. For Gaussian beams, this ultimate limit can be achieved with a single intensity scan, provided the camera is placed at one of two optimal transverse detection planes. Hence, for axial localization there is no need of more co...
| Autores: | , , , , |
|---|---|
| Tipo de recurso: | artículo |
| Fecha de publicación: | 2019 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/6020 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/6020 |
| Access Level: | acceso abierto |
| Palabra clave: | 535 Fluorescence microscopy Óptica (Física) 2209.19 Óptica Física |
| Sumario: | We derive fundamental precision bounds for single-point axial localization. For Gaussian beams, this ultimate limit can be achieved with a single intensity scan, provided the camera is placed at one of two optimal transverse detection planes. Hence, for axial localization there is no need of more complicated detection schemes. The theory is verified with an experimental demonstration of axial resolution 3 orders of magnitude below the classical depth of focus. |
|---|