Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light

We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the re...

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Detalles Bibliográficos
Autores: Albella Echave, Pablo|||0000-0001-7531-7828, Saiz Vega, José María|||0000-0003-3713-9877, Sanz Casado, Juan Marcos, González Fernández, Francisco|||0000-0002-2944-4903, Moreno Gracia, Fernando|||0000-0003-3171-7285
Tipo de recurso: artículo
Fecha de publicación:2009
País:España
Institución:Universidad de Cantabria (UC)
Repositorio:UCrea Repositorio Abierto de la Universidad de Cantabria
Idioma:inglés
OAI Identifier:oai:repositorio.unican.es:10902/3761
Acceso en línea:http://hdl.handle.net/10902/3761
Access Level:acceso abierto
Descripción
Sumario:We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface.

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